Potential of improving the diagnostic level of B-scanners by the wavelet transform

Naizhang Feng; Yi Shen; Zhiyan Liu

Potential of improving the diagnostic level of B-scanners by the wavelet transform

Naizhang Feng^*
, Yi Shen
, Zhiyan Liu

^*Corresponding author for this work

School of Astronautics

Harbin Institute of Technology

Research output: Contribution to conference › Paper › peer-review

Abstract

In view of the low resolution and low contrast problems of B-mode ultrasonic echograms, this paper studies the wavelet method to solve the problems. Based on the multiscale singularity detection of 1-D signals, we present a multiscale interpolation method. Based on the multiscale singularity detection of 2-D signals, we present an edge and contrast enhancement method. The simulation results show that these methods are helpful for improving ultrasonic echogram quality indeed.

Original language	English
Pages	1107-1112
Number of pages	6
State	Published - 2000
Event	IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' - Baltimore, MD, USA Duration: 1 May 2000 → 4 May 2000

Conference

Conference	IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control'
City	Baltimore, MD, USA
Period	1/05/00 → 4/05/00

Cite this

@conference{e07b32b80c8b40b4b56b3567f41f949a,

title = "Potential of improving the diagnostic level of B-scanners by the wavelet transform",

abstract = "In view of the low resolution and low contrast problems of B-mode ultrasonic echograms, this paper studies the wavelet method to solve the problems. Based on the multiscale singularity detection of 1-D signals, we present a multiscale interpolation method. Based on the multiscale singularity detection of 2-D signals, we present an edge and contrast enhancement method. The simulation results show that these methods are helpful for improving ultrasonic echogram quality indeed.",

author = "Naizhang Feng and Yi Shen and Zhiyan Liu",

year = "2000",

language = "英语",

pages = "1107--1112",

note = "IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' ; Conference date: 01-05-2000 Through 04-05-2000",

}

Potential of improving the diagnostic level of B-scanners by the wavelet transform. / Feng, Naizhang; Shen, Yi; Liu, Zhiyan.
2000. 1107-1112 Paper presented at IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control', Baltimore, MD, USA.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Potential of improving the diagnostic level of B-scanners by the wavelet transform

AU - Feng, Naizhang

AU - Shen, Yi

AU - Liu, Zhiyan

PY - 2000

Y1 - 2000

N2 - In view of the low resolution and low contrast problems of B-mode ultrasonic echograms, this paper studies the wavelet method to solve the problems. Based on the multiscale singularity detection of 1-D signals, we present a multiscale interpolation method. Based on the multiscale singularity detection of 2-D signals, we present an edge and contrast enhancement method. The simulation results show that these methods are helpful for improving ultrasonic echogram quality indeed.

AB - In view of the low resolution and low contrast problems of B-mode ultrasonic echograms, this paper studies the wavelet method to solve the problems. Based on the multiscale singularity detection of 1-D signals, we present a multiscale interpolation method. Based on the multiscale singularity detection of 2-D signals, we present an edge and contrast enhancement method. The simulation results show that these methods are helpful for improving ultrasonic echogram quality indeed.

UR - https://www.scopus.com/pages/publications/0033723183

M3 - 论文

AN - SCOPUS:0033723183

SP - 1107

EP - 1112

T2 - IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control'

Y2 - 1 May 2000 through 4 May 2000

ER -

Potential of improving the diagnostic level of B-scanners by the wavelet transform

Abstract

Conference

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