Polarization measurement through combination polarizers

Yunfeng Bai; Linjun Li; Zhelong He; Yanwei Liu; Cheng Ma; Guang Shi; Lu Liu

doi:10.1117/12.2054191

Polarization measurement through combination polarizers

Yunfeng Bai^*
, Linjun Li
, Zhelong He
, Yanwei Liu
, Cheng Ma
, Guang Shi
, Lu Liu

^*Corresponding author for this work

School of Physics

Heilongjiang Institute of Technology
Harbin Engineering University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Polarization measurement approaches only using polarizer and grating is present. The combination polarizers consists of two polarizers: one is γ degree with the X axis; the other is along the Y axis. Binary grating is covered by the combination polarizers, and based on Fraunhofer diffraction, the diffraction intensity formula is deduced. The polarization state of incident light can be gotten by fitting the diffraction pattern with the deduced formula. Compared with the traditional polarization measurement method, this measurement only uses polarizer and grating, therefore, it can be applied to measure a wide wavelength range without replacing device in theory.

Original language	English
Title of host publication	Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics
Subtitle of host publication	Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013
DOIs	https://doi.org/10.1117/12.2054191
State	Published - 2014
Event	Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013 - SuZhou, China Duration: 20 Oct 2013 → 29 Oct 2013

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9142
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013
Country/Territory	China
City	SuZhou
Period	20/10/13 → 29/10/13

Keywords

Fraunhofer diffraction
combination polarizers
grating
polarization measurement

Access to Document

10.1117/12.2054191

Cite this

Bai, Y., Li, L., He, Z., Liu, Y., Ma, C., Shi, G., & Liu, L. (2014). Polarization measurement through combination polarizers. In Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013 Article 91421L (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9142). https://doi.org/10.1117/12.2054191

Bai, Yunfeng ; Li, Linjun ; He, Zhelong et al. / Polarization measurement through combination polarizers. Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013. 2014. (Proceedings of SPIE - The International Society for Optical Engineering).

@inproceedings{2980265b19ad483681a5353d140a6953,

title = "Polarization measurement through combination polarizers",

abstract = "Polarization measurement approaches only using polarizer and grating is present. The combination polarizers consists of two polarizers: one is γ degree with the X axis; the other is along the Y axis. Binary grating is covered by the combination polarizers, and based on Fraunhofer diffraction, the diffraction intensity formula is deduced. The polarization state of incident light can be gotten by fitting the diffraction pattern with the deduced formula. Compared with the traditional polarization measurement method, this measurement only uses polarizer and grating, therefore, it can be applied to measure a wide wavelength range without replacing device in theory.",

keywords = "Fraunhofer diffraction, combination polarizers, grating, polarization measurement",

author = "Yunfeng Bai and Linjun Li and Zhelong He and Yanwei Liu and Cheng Ma and Guang Shi and Lu Liu",

year = "2014",

doi = "10.1117/12.2054191",

language = "英语",

isbn = "9781628410938",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics",

note = "Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013 ; Conference date: 20-10-2013 Through 29-10-2013",

}

Bai, Y, Li, L, He, Z, Liu, Y, Ma, C, Shi, G & Liu, L 2014, Polarization measurement through combination polarizers. in Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013., 91421L, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9142, Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013, SuZhou, China, 20/10/13. https://doi.org/10.1117/12.2054191

Polarization measurement through combination polarizers. / Bai, Yunfeng; Li, Linjun; He, Zhelong et al.
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013. 2014. 91421L (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9142).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Polarization measurement through combination polarizers

AU - Bai, Yunfeng

AU - Li, Linjun

AU - He, Zhelong

AU - Liu, Yanwei

AU - Ma, Cheng

AU - Shi, Guang

AU - Liu, Lu

PY - 2014

Y1 - 2014

N2 - Polarization measurement approaches only using polarizer and grating is present. The combination polarizers consists of two polarizers: one is γ degree with the X axis; the other is along the Y axis. Binary grating is covered by the combination polarizers, and based on Fraunhofer diffraction, the diffraction intensity formula is deduced. The polarization state of incident light can be gotten by fitting the diffraction pattern with the deduced formula. Compared with the traditional polarization measurement method, this measurement only uses polarizer and grating, therefore, it can be applied to measure a wide wavelength range without replacing device in theory.

AB - Polarization measurement approaches only using polarizer and grating is present. The combination polarizers consists of two polarizers: one is γ degree with the X axis; the other is along the Y axis. Binary grating is covered by the combination polarizers, and based on Fraunhofer diffraction, the diffraction intensity formula is deduced. The polarization state of incident light can be gotten by fitting the diffraction pattern with the deduced formula. Compared with the traditional polarization measurement method, this measurement only uses polarizer and grating, therefore, it can be applied to measure a wide wavelength range without replacing device in theory.

KW - Fraunhofer diffraction

KW - combination polarizers

KW - grating

KW - polarization measurement

UR - https://www.scopus.com/pages/publications/84896784290

U2 - 10.1117/12.2054191

DO - 10.1117/12.2054191

M3 - 会议稿件

AN - SCOPUS:84896784290

SN - 9781628410938

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics

T2 - Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013

Y2 - 20 October 2013 through 29 October 2013

ER -

Bai Y, Li L, He Z, Liu Y, Ma C, Shi G et al. Polarization measurement through combination polarizers. In Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics: Optical Imaging, Remote Sensing, and Laser-Matter Interaction 2013. 2014. 91421L. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2054191

Polarization measurement through combination polarizers

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