Skip to main navigation Skip to search Skip to main content

Planar scanning method for detecting refraction characteristics of two-dimensional photonic quasi-crystal wedge-shaped prisms

  • Jianjun Liu*
  • , Wei Tan
  • , Exian Liu
  • , Haili Hu
  • , Zhigang Fan
  • , Tianhua Zhang
  • , Xiong Zhang
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

In this study, a planar scanning method is proposed. This novel method adapts two monitors moving along double planar tracks that can be used to detect refraction characteristics of two-dimensional (2D) photonic quasi-crystal (PQC) wedge-shaped prisms. Refraction of a decagonal Penrose-type PQC prism is analyzed for a given incident beam and two polarization modes at different incident positions in the prism using this method. Refraction from the prism is irregular, indicating that nonuniformity in the arrangement of scatterers in the prism causes Bragg-like scattering irregularities. Numerical results show that this method can be used for guiding the design of a 2D PQC prism and for the analysis of its refraction characteristics.

Original languageEnglish
Pages (from-to)978-983
Number of pages6
JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
Volume33
Issue number5
DOIs
StatePublished - May 2016
Externally publishedYes

Fingerprint

Dive into the research topics of 'Planar scanning method for detecting refraction characteristics of two-dimensional photonic quasi-crystal wedge-shaped prisms'. Together they form a unique fingerprint.

Cite this