Abstract
The reliability of aerospace electronic components operating under extreme conditions is crucial to mission success. Physics-of-failure (PoF) modeling provides mechanism-based reliability analysis, yet its deployment in aerospace electronics is hindered by scarce target-domain data, high test cost, and strong sensitivity of PoF coefficients to manufacturing variability. This article proposes a PoF-guided transfer learning framework that quantifies the influence of manufacturing parameters on PoF model coefficients and evaluates source–target transferability using a dispersion-aware maximum mean discrepancy (MMD) metric that jointly accounts for mean discrepancy and distance variance in reproducing kernel Hilbert space (RKHS). A physically consistent transfer model is then constructed via a hybrid base learner (HBL) with an RMSE-driven reweighting strategy. Experiments on MOSFET and aerospace electromagnetic relays show that domain similarity grades align well with transfer performance, achieving a perfect Spearman’s rank correlate ion coefficient (Ρ = 1) in 83.3% (10/12) of evaluations. The proposed framework attains maximum relative errors of 6.08% and 2.19% for representative PoF coefficients, and achieves a minimum R2 of 0.992 with a maximum mean squared error (mse) of 6.51 x 10-5, outperforming individual tree-based learners and representative transfer baselines. Because the workflow only requires measurable manufacturing parameters, a parametric PoF form, and limited target-domain samples, it provides a generally applicable pathway for reliability-oriented PoF modeling and prediction of aerospace electronic components under manufacturing variations.
| Original language | English |
|---|---|
| Pages (from-to) | 6988-7006 |
| Number of pages | 19 |
| Journal | IEEE Sensors Journal |
| Volume | 26 |
| Issue number | 5 |
| DOIs | |
| State | Published - 2026 |
Keywords
- Aerospace electronic component
- manufacturing parameter
- physics of failure (PoF)
- reliability
- transfer learning
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