Perturbative analysis of photorefractive fundamental space-charge field with phase modulation at large modulation depths

Shoucheng Yang; Man Kong; Qiuyu Wan; Congjing Yang; Zhongxiang Zhou; Kebin Xu

doi:10.1117/12.304522

Perturbative analysis of photorefractive fundamental space-charge field with phase modulation at large modulation depths

Shoucheng Yang^*
, Man Kong
, Qiuyu Wan
, Congjing Yang
, Zhongxiang Zhou
, Kebin Xu

^*Corresponding author for this work

Harbin University of Science and Technology

Research output: Contribution to journal › Conference article › peer-review

Abstract

We discussed the kinetics of the photorefractive fundamental space-charge field with phase-modulation at large modulation depth of the interference pattern When no external field is applied, the influence of large modulation on the corrected modulation function must be considered at low phase-modulation frequency and at small diffusion field. For the drifted case, the corrected modulation function will increase with increase of the external applied field.

Original language	English
Pages (from-to)	171-175
Number of pages	5
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3294
DOIs	https://doi.org/10.1117/12.304522
State	Published - 1998
Externally published	Yes
Event	Holographic Materials IV - San Jose, CA, United States Duration: 27 Jan 1998 → 27 Jan 1998

Keywords

Corrected modulation function
Fundamental space-charge field
Phase-modulation

Access to Document

10.1117/12.304522

Cite this

@article{31710374002a451ea62351e0809e231e,

title = "Perturbative analysis of photorefractive fundamental space-charge field with phase modulation at large modulation depths",

abstract = "We discussed the kinetics of the photorefractive fundamental space-charge field with phase-modulation at large modulation depth of the interference pattern When no external field is applied, the influence of large modulation on the corrected modulation function must be considered at low phase-modulation frequency and at small diffusion field. For the drifted case, the corrected modulation function will increase with increase of the external applied field.",

keywords = "Corrected modulation function, Fundamental space-charge field, Phase-modulation",

author = "Shoucheng Yang and Man Kong and Qiuyu Wan and Congjing Yang and Zhongxiang Zhou and Kebin Xu",

year = "1998",

doi = "10.1117/12.304522",

language = "英语",

volume = "3294",

pages = "171--175",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Holographic Materials IV ; Conference date: 27-01-1998 Through 27-01-1998",

}

TY - JOUR

T1 - Perturbative analysis of photorefractive fundamental space-charge field with phase modulation at large modulation depths

AU - Yang, Shoucheng

AU - Kong, Man

AU - Wan, Qiuyu

AU - Yang, Congjing

AU - Zhou, Zhongxiang

AU - Xu, Kebin

PY - 1998

Y1 - 1998

N2 - We discussed the kinetics of the photorefractive fundamental space-charge field with phase-modulation at large modulation depth of the interference pattern When no external field is applied, the influence of large modulation on the corrected modulation function must be considered at low phase-modulation frequency and at small diffusion field. For the drifted case, the corrected modulation function will increase with increase of the external applied field.

AB - We discussed the kinetics of the photorefractive fundamental space-charge field with phase-modulation at large modulation depth of the interference pattern When no external field is applied, the influence of large modulation on the corrected modulation function must be considered at low phase-modulation frequency and at small diffusion field. For the drifted case, the corrected modulation function will increase with increase of the external applied field.

KW - Corrected modulation function

KW - Fundamental space-charge field

KW - Phase-modulation

UR - https://www.scopus.com/pages/publications/0032400647

U2 - 10.1117/12.304522

DO - 10.1117/12.304522

M3 - 会议文章

AN - SCOPUS:0032400647

SN - 0277-786X

VL - 3294

SP - 171

EP - 175

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Holographic Materials IV

Y2 - 27 January 1998 through 27 January 1998

ER -

Perturbative analysis of photorefractive fundamental space-charge field with phase modulation at large modulation depths

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this