TY - GEN
T1 - PerfDBT
T2 - 38th IEEE International Conference on Computer Design, ICCD 2020
AU - Wu, Jin
AU - Dong, Jian
AU - Fang, Ruili
AU - Wang, Wenwen
AU - Zuo, Decheng
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/10
Y1 - 2020/10
N2 - Dynamic binary translation (DBT) has been adopted in many important applications. Due to the large scale and complexity of a DBT system, a minor code change may lead to unexpected impact on the performance. Therefore, it is necessary to conduct performance regression testing for DBT systems. However, existing benchmark suites are not suitable for daily performance testing due to the extremely-long testing time. To address this challenge, we propose PerffiBT, which employs a novel approach to automatically generate test programs from existing long-running benchmarks. The execution times of the generated test programs are much shorter, which allows them to be used for daily performance regression testing of a DBT system. Experimental results demonstrate that the test programs generated by PerfDBT can achieve an average of 71X testing efficiency compared to original benchmarks. Furthermore, it can also deliver similar testing results to original benchmarks.
AB - Dynamic binary translation (DBT) has been adopted in many important applications. Due to the large scale and complexity of a DBT system, a minor code change may lead to unexpected impact on the performance. Therefore, it is necessary to conduct performance regression testing for DBT systems. However, existing benchmark suites are not suitable for daily performance testing due to the extremely-long testing time. To address this challenge, we propose PerffiBT, which employs a novel approach to automatically generate test programs from existing long-running benchmarks. The execution times of the generated test programs are much shorter, which allows them to be used for daily performance regression testing of a DBT system. Experimental results demonstrate that the test programs generated by PerfDBT can achieve an average of 71X testing efficiency compared to original benchmarks. Furthermore, it can also deliver similar testing results to original benchmarks.
UR - https://www.scopus.com/pages/publications/85098850022
U2 - 10.1109/ICCD50377.2020.00071
DO - 10.1109/ICCD50377.2020.00071
M3 - 会议稿件
AN - SCOPUS:85098850022
T3 - Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
SP - 389
EP - 392
BT - Proceedings - 2020 IEEE 38th International Conference on Computer Design, ICCD 2020
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 18 October 2020 through 21 October 2020
ER -