Abstract
Conventional atomic force microscope nanomanipulation is inefficient because of the serial imaging/manipulation operation. We present here a parallel imaging/manipulation force microscope (PIMM) to improve manipulation efficiency. The PIMM is equipped with two individually actuated cantilevers with protrudent tips. One cantilever acts as an imaging sensor by scanning nano-objects and tip of the other cantilever that is used as a manipulating tool. Two manipulation schemes were introduced to fulfill parallel imaging/manipulation tasks with normal and high-speed image scan, respectively. Performance of the PIMM was validated by the parallel imaging/manipulation of nanoparticles to form a nanopattern with a commonly used pushing operation.
| Original language | English |
|---|---|
| Article number | 153106 |
| Journal | Applied Physics Letters |
| Volume | 94 |
| Issue number | 15 |
| DOIs | |
| State | Published - 2009 |
| Externally published | Yes |
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