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Optimization of heat dissipation design for high-power SiC SSPC based on icepak thermal simulation

  • Hongyu Zhang
  • , Kangyao Lai
  • , Shuang Si
  • , Yan Zhu
  • , Kaixin Zhang
  • , Shujuan Wang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

With the increase of power level, the research of high-power and high-reliability SiC SSPC has become a hot spot in the industry. The heat generated by SSPC work will also increase greatly due to the increase of current level. As the power core device of SiC SSPC, overheating damage of SiC MOSFET is one of the main causes of its failure. The SiC MOSFET in the die package mode can effectively improve the heat dissipation performance of the SSPC under high current operation and can significantly reduce the size of the SSPC. However, there are few studies on the actual heat dissipation and heat dissipation performance optimization of die-packaged SSPC. This paper takes 20A DC high-power SiC SSPC working in high temperature environment as the research object. Firstly, temperature field simulation analysis of die-packaged SiC SSPC is carried out based on the actual working conditions. Then, the electrical characteristics of the SiC MOSFET power part of SSPC operating under different ambient temperature and load conditions are analyzed. Finally, using the DOE experimental design algorithm, and considering the junction temperature and switching characteristics of the SiC MOSFET and the process level of the heat sink, the structure of the SiC MOSFET's heat sink is parametrically analyzed and getting the heat sink optimized design scheme, and verify the correctness of the optimization scheme through temperature field simulation analysis.

Original languageEnglish
Title of host publicationProceedings of the 7th International Conference on Reliability of Electrical Products and Electrical Contacts, ICREPEC 2019
EditorsJingqin Wang, Jingying Zhao
PublisherInternational Academic Publishers
Pages193-198
Number of pages6
ISBN (Electronic)9789881532343
StatePublished - 2019
Event7th International Conference on Reliability of Electrical Products and Electrical Contacts, ICREPEC 2019 - Suzhou, China
Duration: 4 Nov 20196 Nov 2019

Publication series

NameProceedings of the 7th International Conference on Reliability of Electrical Products and Electrical Contacts, ICREPEC 2019

Conference

Conference7th International Conference on Reliability of Electrical Products and Electrical Contacts, ICREPEC 2019
Country/TerritoryChina
CitySuzhou
Period4/11/196/11/19

Keywords

  • Die-packaged SiC MOSFET
  • High-power SiC SSPC
  • Optimized design
  • Thermal simulation

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