Optical nonlinearity of MEH-PPV thin film

Yongping Bai; Zonghao Huang; Yuxiao Wang; Bonan Kang; Hasiwuliji

doi:10.1117/12.408369

Optical nonlinearity of MEH-PPV thin film

Yongping Bai
, Zonghao Huang
, Yuxiao Wang
, Bonan Kang
, Hasiwuliji

Northeast Normal University
Jilin University

Research output: Contribution to journal › Conference article › peer-review

Abstract

The Z-scan technique was used to investigate the third-order optical nonlinearity of MEH-PPV and PPV thin-films. The measured magnitude of every x⁽³) of the two polymers was the order of 10^-9 esu and the x⁽³) of MEH-PPV was larger than that of PPV's. At the same time, the crystal orbital program was used to calculate the electronic structure of two polymers. According to our discussion, the p-(pi) conjugation between the oxygen atom and the PPV main chain in the MEH-PPV should be one of the main reasons for MEH-PPV having the larger x⁽³) value.

Original language	English
Pages (from-to)	741-744
Number of pages	4
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4086
DOIs	https://doi.org/10.1117/12.408369
State	Published - 2000
Event	4th International Conference on Thin Film Physics and Applications - Shanghai, China Duration: 8 May 2000 → 11 May 2000

Keywords

Conjugated polymer thin-film
MEH-PPV
Optical nonlinearity
PPV

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10.1117/12.408369

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@article{d2177755819c438a95dcfa2922c8c895,

title = "Optical nonlinearity of MEH-PPV thin film",

abstract = "The Z-scan technique was used to investigate the third-order optical nonlinearity of MEH-PPV and PPV thin-films. The measured magnitude of every x(3) of the two polymers was the order of 10-9 esu and the x(3) of MEH-PPV was larger than that of PPV's. At the same time, the crystal orbital program was used to calculate the electronic structure of two polymers. According to our discussion, the p-(pi) conjugation between the oxygen atom and the PPV main chain in the MEH-PPV should be one of the main reasons for MEH-PPV having the larger x(3) value.",

keywords = "Conjugated polymer thin-film, MEH-PPV, Optical nonlinearity, PPV",

author = "Yongping Bai and Zonghao Huang and Yuxiao Wang and Bonan Kang and Hasiwuliji",

note = "Publisher Copyright: {\textcopyright} 200 COPYRIGHT SPIE.; 4th International Conference on Thin Film Physics and Applications ; Conference date: 08-05-2000 Through 11-05-2000",

year = "2000",

doi = "10.1117/12.408369",

language = "英语",

volume = "4086",

pages = "741--744",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

}

TY - JOUR

T1 - Optical nonlinearity of MEH-PPV thin film

AU - Bai, Yongping

AU - Huang, Zonghao

AU - Wang, Yuxiao

AU - Kang, Bonan

AU - Hasiwuliji,

N1 - Publisher Copyright: © 200 COPYRIGHT SPIE.

PY - 2000

Y1 - 2000

N2 - The Z-scan technique was used to investigate the third-order optical nonlinearity of MEH-PPV and PPV thin-films. The measured magnitude of every x(3) of the two polymers was the order of 10-9 esu and the x(3) of MEH-PPV was larger than that of PPV's. At the same time, the crystal orbital program was used to calculate the electronic structure of two polymers. According to our discussion, the p-(pi) conjugation between the oxygen atom and the PPV main chain in the MEH-PPV should be one of the main reasons for MEH-PPV having the larger x(3) value.

AB - The Z-scan technique was used to investigate the third-order optical nonlinearity of MEH-PPV and PPV thin-films. The measured magnitude of every x(3) of the two polymers was the order of 10-9 esu and the x(3) of MEH-PPV was larger than that of PPV's. At the same time, the crystal orbital program was used to calculate the electronic structure of two polymers. According to our discussion, the p-(pi) conjugation between the oxygen atom and the PPV main chain in the MEH-PPV should be one of the main reasons for MEH-PPV having the larger x(3) value.

KW - Conjugated polymer thin-film

KW - MEH-PPV

KW - Optical nonlinearity

KW - PPV

UR - https://www.scopus.com/pages/publications/85089085032

U2 - 10.1117/12.408369

DO - 10.1117/12.408369

M3 - 会议文章

AN - SCOPUS:85089085032

SN - 0277-786X

VL - 4086

SP - 741

EP - 744

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - 4th International Conference on Thin Film Physics and Applications

Y2 - 8 May 2000 through 11 May 2000

ER -

Optical nonlinearity of MEH-PPV thin film

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Keywords

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