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Optical nonlinearity measurements of copper phthalocyanine film

  • Li Hao Luo
  • , Yu Fang
  • , Xiang Yong Chu
  • , Xing Zhi Wu
  • , Junyi Yu
  • , Ying Lin Song*
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The nonlinear refractive response of a copper phthalocyanine film fabricated by the electro-deposition is investigated by a modified top-hat Z-scan with 19 picoseconds pulse at wavelength of 532 nm. Compared to the top-hat Z-scan, the curve of modified top-hat Z-scan for the nonlinear refraction shows a single peak rather than a peek-valley curve. Furthermore, the sensitivity of this new technique can be more than two orders of magnitude enhanced. The results show that the film has obvious response of nonlinear refraction. The theoretical simulation fit well with experimental results.

Original languageEnglish
Title of host publicationInternational Symposium on Photoelectronic Detection and Imaging 2013
Subtitle of host publicationHigh Power Lasers and Applications
DOIs
StatePublished - 2013
Event5th International Symposium on Photoelectronic Detection and Imaging, ISPDI 2013 - Beijing, China
Duration: 25 Jun 201327 Jun 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8904
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference5th International Symposium on Photoelectronic Detection and Imaging, ISPDI 2013
Country/TerritoryChina
CityBeijing
Period25/06/1327/06/13

Keywords

  • Copper phthalocyanine film
  • Modified top-hat Z-scan
  • Optical nonlinearity

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