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One-step femtosecond laser-induced monocrystalline silicon structure towards enhanced nano-hardness

  • Yanan Liu
  • , Ye Ding*
  • , Liangliang Xu
  • , In Wha Jeong
  • , Lijun Yang
  • *Corresponding author for this work
  • School of Mechatronics Engineering, Harbin Institute of Technology
  • Harbin Institute of Technology
  • Hanyang University
  • Dong-A University

Research output: Contribution to journalArticlepeer-review

Abstract

In this work, a one-step fs laser-induced monocrystalline silicon (Si) structure was fabricated to improve the nano-hardness properties. According to the atomic structure, three layers were found in the irradiated Si structure, namely, the amorphous Si (a-Si) layer, dislocation layer, and Si crystal layer. The a-Si layer on the surface layer was attributed to the re-solidification of melting Si material, while the dislocation layer between the a-Si and Si crystal layers contained numerous dislocations and lattice distortions, which positively affected the nano-hardness of the irradiated Si structure. The Si crystal layer was not affected by laser irradiation and maintained the initial atomic structure. This work provides a new perspective on the phase transition and microstructure study of fs laser-induced structures.

Original languageEnglish
Article number132792
JournalMaterials Letters
Volume325
DOIs
StatePublished - 15 Oct 2022

Keywords

  • Hardness
  • Indentation
  • Laser processing
  • Microstructure
  • Semiconductors

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