Skip to main navigation Skip to search Skip to main content

OmniVTON: Training-Free Universal Virtual Try-On

  • Zhaotong Yang
  • , Yuhui Li
  • , Shengfeng He
  • , Xinzhe Li
  • , Yangyang Xu
  • , Junyu Dong
  • , Yong Du*
  • *Corresponding author for this work
  • Ocean University of China
  • Singapore Management University
  • Harbin Institute of Technology Shenzhen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Image-based Virtual Try-On (VTON) techniques rely on either supervised in-shop approaches, which ensure high fidelity but struggle with cross-domain generalization, or unsupervised in-the-wild methods, which improve adaptability but remain constrained by data biases and limited universality. A unified, training-free solution that works across both scenarios remains an open challenge. We propose OmniVTON, the first training-free universal VTON framework that decouples garment and pose conditioning to achieve both texture fidelity and pose consistency across diverse settings. To preserve garment details, we introduce a garment prior generation mechanism that aligns clothing with the body, followed by continuous boundary stitching technique to achieve fine-grained texture retention. For precise pose alignment, we utilize DDIM inversion to capture structural cues while suppressing texture interference, ensuring accurate body alignment independent of the original image textures. By disentangling garment and pose constraints, OmniVTON eliminates the bias inherent in diffusion models when handling multiple conditions simultaneously. Experimental results demonstrate that OmniVTON achieves superior performance across diverse datasets, garment types, and application scenarios. Notably, it is the first framework capable of multi-human VTON, enabling realistic garment transfer across multiple individuals in a single scene. Code is available at https://github.com/JeromeYoung/OmniVTON.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages16702-16711
Number of pages10
ISBN (Electronic)9798331587758
DOIs
StatePublished - 2025
Externally publishedYes
Event2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025 - Honolulu, United States
Duration: 19 Oct 202523 Oct 2025

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499
ISSN (Electronic)2380-7504

Conference

Conference2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025
Country/TerritoryUnited States
CityHonolulu
Period19/10/2523/10/25

Fingerprint

Dive into the research topics of 'OmniVTON: Training-Free Universal Virtual Try-On'. Together they form a unique fingerprint.

Cite this