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Observations and analysis of extreme ultraviolet emission by capillary discharge with Xe as target

  • Qiang Xu*
  • , Yong Peng Zhao
  • , Zhi Liang Guan
  • , Ye Zhang
  • , Qi Wang
  • , Qi Li
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The first capillary discharge produced plasma extreme ultraviolet source has been started in China. Fundamental characteristics of DPP including current, Xe gas pressure, extreme ultraviolet energy and spectrum in extreme ultraviolet region have been studied. A high voltage power source is employed, which voltage can be changed from 20kV to 30kV, and the current is from 25kA to 45kA with a FWHM of 120ns. The high voltage is loaded between the capillary which is 3mm in diameter and 12mm in length by injected Xe gas to achieve extreme ultraviolet radiation mostly in the region 10nm∼18nm developed in framework of an extreme ultraviolet lithograph program. It is founded that the in-band (13.5nm, 2% bandwidth) energy is increasing with decreasing Xe gas pressure and/or increasing the current in the region 5∼10Pa and 25kA∼45kA. And 0.56J/2π sr/pulse energy (13.5nm, 2% bandwidth) can be got when the input energy is 47.7J, and the conversion efficiency is 0.56%.

Original languageEnglish
Title of host publication2010 Academic Symposium on Optoelectronics and Microelectronics Technology and 10th Chinese-Russian Symposium on Laser Physics and Laser Technology, RCSLPLT/ASOT 2010
Pages213-216
Number of pages4
DOIs
StatePublished - 2010
Event2010 Academic Symposium on Optoelectronics and Microelectronics Technology and 10th Chinese-Russian Symposium on Laser Physics and Laser Technology, RCSLPLT/ASOT 2010 - Harbin, China
Duration: 28 Jul 20101 Aug 2010

Publication series

Name2010 Academic Symposium on Optoelectronics and Microelectronics Technology and 10th Chinese-Russian Symposium on Laser Physics and Laser Technology, RCSLPLT/ASOT 2010

Conference

Conference2010 Academic Symposium on Optoelectronics and Microelectronics Technology and 10th Chinese-Russian Symposium on Laser Physics and Laser Technology, RCSLPLT/ASOT 2010
Country/TerritoryChina
CityHarbin
Period28/07/101/08/10

Keywords

  • 13.5nm emission
  • Capillary discharge
  • EUV source
  • Extreme ultravilet lithograph
  • Xe discharge

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