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Observation and Understanding of the Initial Unstable Electrical Contact Behaviors

  • Wanbin Ren*
  • , Nan Jiang
  • , Cheng Chang
  • , Shengjun Xue
  • , Yu Chen
  • , Ronald A. Coutu
  • *Corresponding author for this work
  • School of Electrical Engineering and Automation, Harbin Institute of Technology
  • Marquette University

Research output: Contribution to journalArticlepeer-review

Abstract

Reliable and long-lifetime electrical contact is a very important issue in the field of radio frequency microelectromechanical systems (MEMS) and in energy transmission applications. In this paper, the initial unstable electrical contact phenomena under the conditions of micro-newton-scale contact force and nanometer-scale contact gap have been experimentally observed. The repetitive contact bounces at nanoscale are confirmed by the measured instantaneous waveforms of contact force and contact voltage. Moreover, the corresponding physical model for describing the competition between the electrostatic force and the restoring force of the mobile contact is present. Then, the dynamic process of contact closure is explicitly calculated with the numerical method. Finally, the effects of spring rigidness and open voltage on the unstable electrical contact behaviors are investigated experimentally and theoretically. This paper highlights that in MEMS systems switch, minimal actuation velocity is required to prevent mechanical bounce and excessive wear.

Original languageEnglish
Article number7924351
Pages (from-to)1272-1279
Number of pages8
JournalIEEE Transactions on Components, Packaging and Manufacturing Technology
Volume7
Issue number8
DOIs
StatePublished - Aug 2017
Externally publishedYes

Keywords

  • Contact bounce
  • electrical contact
  • electrostatic force
  • microelectromechanical systems (MEMS) switch
  • restoring force

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