Novel operation mode for eliminating influence of inclination angle and friction in atomic force microscopy

Fei Wang; Yueyu Wang; Faquan Zhou; Xuezeng Zhao

doi:10.1017/S1431927609095816

Novel operation mode for eliminating influence of inclination angle and friction in atomic force microscopy

Fei Wang^*
, Yueyu Wang
, Faquan Zhou
, Xuezeng Zhao

^*Corresponding author for this work

School of Mechatronics Engineering

Harbin Institute of Technology

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1136-1137
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609095816
State	Published - Jul 2009

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title = "Novel operation mode for eliminating influence of inclination angle and friction in atomic force microscopy",

author = "Fei Wang and Yueyu Wang and Faquan Zhou and Xuezeng Zhao",

year = "2009",

month = jul,

doi = "10.1017/S1431927609095816",

language = "英语",

volume = "15",

pages = "1136--1137",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Novel operation mode for eliminating influence of inclination angle and friction in atomic force microscopy

AU - Wang, Fei

AU - Wang, Yueyu

AU - Zhou, Faquan

AU - Zhao, Xuezeng

PY - 2009/7

Y1 - 2009/7

UR - https://www.scopus.com/pages/publications/69949120582

U2 - 10.1017/S1431927609095816

DO - 10.1017/S1431927609095816

M3 - 文章

AN - SCOPUS:69949120582

SN - 1431-9276

VL - 15

SP - 1136

EP - 1137

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Novel operation mode for eliminating influence of inclination angle and friction in atomic force microscopy

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