Novel memristor-based nonvolatile d latch and flip-flop designs

  • Zhenxing Chang
  • , Aijiao Cui*
  • , Ziming Wang
  • , Gang Qu
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Sequential devices are the fundamental building blocks for almost all digital electronic systems with memory. Due to the importance of instant data recovery after unexpected data loss such as unplanned power down, sequential devices need to have the nonvolatile property, which motivates the recent research and practice in integrating the nonvolatile memristor into CMOS devices. In this paper, we study how to apply this approach to improve the quality of nonvolatile D latch. Unlike the structure of conventional design, the proposed D latch consists of only one memristor, several transmission gates, and CMOS inverters. Our design overcomes the negative effect due to the threshold loss of the transistors. As simulation shows, compared with the current designs, our proposed memristor-based D latch can support the memristor to switch between different resistance states 2.3X-3.6X faster, and thus achieving a clock of higher frequency. In addition, our design allows the threshold value of the memristor to be selected from a much wider range. As an application, we use the proposed memristor-based D latch to implement a nonvolatile master-slave D flip-flop, which has smaller delay than all the state-of the-art designs and smaller area than all but one of them. Our designs improve the quality of memristor-based D latch and D flip-flop in terms of latency, area, and flexibility of threshold voltage selection, making them a promising option for data backup in real life systems.

Original languageEnglish
Title of host publicationProceedings of the 22nd International Symposium on Quality Electronic Design, ISQED 2021
PublisherIEEE Computer Society
Pages244-251
Number of pages8
ISBN (Electronic)9781728176413
DOIs
StatePublished - 7 Apr 2021
Externally publishedYes
Event22nd International Symposium on Quality Electronic Design, ISQED 2021 - Santa Clara, United States
Duration: 7 Apr 20219 Apr 2021

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
Volume2021-April
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Conference

Conference22nd International Symposium on Quality Electronic Design, ISQED 2021
Country/TerritoryUnited States
CitySanta Clara
Period7/04/219/04/21

Keywords

  • D latch
  • Master-slave D flip-flop
  • Memristor
  • Nonvolatile

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