Neural networks based test generation algorithm for combinational logic circuits

A new test generation algorithm based neural networks which does not need propagation and backtracks is proposed to represent the combinatory circuits as a bidirectional network of neurons using the Hopfield nets. A constraint network of the circuits under test was constructed through a fault injection, and an energy function was also constructed with global minima at test vectors. A genetic algorithm was used for test generation, and the experimental results on some combinational circuits demonstrate the feasibility of this algorithm.