Nature of Electron Scattering in LaAlO3/SrTiO3 Interfaces Near the Critical Thickness

C. J. Li; W. M. Lü; X. Renshaw Wang; X. P. Qiu; L. Sun; S. W. Zeng; Z. Q. Liu; Z. Huang; Y. L. Zhao; Ariando; T. Venkatesan

doi:10.1002/admi.201400437

Nature of Electron Scattering in LaAlO₃/SrTiO₃ Interfaces Near the Critical Thickness

C. J. Li
, W. M. Lü^*
, X. Renshaw Wang
, X. P. Qiu
, L. Sun
, S. W. Zeng
, Z. Q. Liu
, Z. Huang
, Y. L. Zhao
, Ariando
, T. Venkatesan

^*Corresponding author for this work

National University of Singapore
University of Twente

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Abrupt metal-to-insulator transition at the polar (e.g., LaAlO₃) and nonpolar oxide (e.g., SrTiO₃) heterointerfaces is fascinating. In the vicinity of the metal-to-insulator transition critical thickness where the exact critical thickness is found to be 3.65 ± 0.05 uc, strain, carrier concentration, and Kondo induced scattering manifest their great sensitive role on carrier mobility in LaAlO₃/SrTiO₃ interfaces.

Original language	English
Article number	1400437
Journal	Advanced Materials Interfaces
Volume	2
Issue number	1
DOIs	https://doi.org/10.1002/admi.201400437
State	Published - 1 Jan 2015
Externally published	Yes

Keywords

Kondo effect
LaAlO/SrTiO interfaces
metal-insulator transition
mobility
strain

Access to Document

10.1002/admi.201400437

Cite this

@article{dbe512e900e94793a68f4751705081df,

title = "Nature of Electron Scattering in LaAlO3/SrTiO3 Interfaces Near the Critical Thickness",

abstract = "Abrupt metal-to-insulator transition at the polar (e.g., LaAlO3) and nonpolar oxide (e.g., SrTiO3) heterointerfaces is fascinating. In the vicinity of the metal-to-insulator transition critical thickness where the exact critical thickness is found to be 3.65 ± 0.05 uc, strain, carrier concentration, and Kondo induced scattering manifest their great sensitive role on carrier mobility in LaAlO3/SrTiO3 interfaces.",

keywords = "Kondo effect, LaAlO/SrTiO interfaces, metal-insulator transition, mobility, strain",

author = "Li, \{C. J.\} and L{\"u}, \{W. M.\} and Wang, \{X. Renshaw\} and Qiu, \{X. P.\} and L. Sun and Zeng, \{S. W.\} and Liu, \{Z. Q.\} and Z. Huang and Zhao, \{Y. L.\} and Ariando and T. Venkatesan",

note = "Publisher Copyright: {\textcopyright} 2014 WILEY-VCH Verlag GmbH \& Co. KGaA, Weinheim.",

year = "2015",

month = jan,

day = "1",

doi = "10.1002/admi.201400437",

language = "英语",

volume = "2",

journal = "Advanced Materials Interfaces",

issn = "2196-7350",

publisher = "John Wiley and Sons Ltd",

number = "1",

}

TY - JOUR

T1 - Nature of Electron Scattering in LaAlO3/SrTiO3 Interfaces Near the Critical Thickness

AU - Li, C. J.

AU - Lü, W. M.

AU - Wang, X. Renshaw

AU - Qiu, X. P.

AU - Sun, L.

AU - Zeng, S. W.

AU - Liu, Z. Q.

AU - Huang, Z.

AU - Zhao, Y. L.

AU - Ariando,

AU - Venkatesan, T.

PY - 2015/1/1

Y1 - 2015/1/1

N2 - Abrupt metal-to-insulator transition at the polar (e.g., LaAlO3) and nonpolar oxide (e.g., SrTiO3) heterointerfaces is fascinating. In the vicinity of the metal-to-insulator transition critical thickness where the exact critical thickness is found to be 3.65 ± 0.05 uc, strain, carrier concentration, and Kondo induced scattering manifest their great sensitive role on carrier mobility in LaAlO3/SrTiO3 interfaces.

AB - Abrupt metal-to-insulator transition at the polar (e.g., LaAlO3) and nonpolar oxide (e.g., SrTiO3) heterointerfaces is fascinating. In the vicinity of the metal-to-insulator transition critical thickness where the exact critical thickness is found to be 3.65 ± 0.05 uc, strain, carrier concentration, and Kondo induced scattering manifest their great sensitive role on carrier mobility in LaAlO3/SrTiO3 interfaces.

KW - Kondo effect

KW - LaAlO/SrTiO interfaces

KW - metal-insulator transition

KW - mobility

KW - strain

UR - https://www.scopus.com/pages/publications/84938614103

U2 - 10.1002/admi.201400437

DO - 10.1002/admi.201400437

M3 - 文章

AN - SCOPUS:84938614103

SN - 2196-7350

VL - 2

JO - Advanced Materials Interfaces

JF - Advanced Materials Interfaces

IS - 1

M1 - 1400437

ER -

Nature of Electron Scattering in LaAlO₃/SrTiO₃ Interfaces Near the Critical Thickness

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this