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Nanoprecision aligned wafer direct bonding and its outlook

  • Chenxi Wang*
  • , Tadatomo Suga
  • *Corresponding author for this work
  • The University of Tokyo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A nanoprecision aligned wafer bonding is presented enabling creating innovative nanostructures. To achieve high-precision wafer bonding, a perfect alignment as well as room-temperature bonding process is necessary. In this paper, the limit of typical alignment methods is addressed firstly and a moire fringe assisted alignment method is developed to breakthrough the limit. Moreover, in order to realize room-temperature bonding without heating, a fluorine containing plasma activation is developed to combine silicon and silicon oxide wafers in air. On the other hand, a process flow consisting of the precise alignment and room-temperature bonding processes with in-situ strategy is demonstrated to realize the nanoprecison aligned wafer bonding. The proposed strategy provides one of possible solutions for development of aligned wafer bonding tools, which will open up opportunities in 3D integration circuits, 3D photonic crystals, and advanced nanotransistors.

Original languageEnglish
Title of host publicationICEPT-HDP 2011 Proceedings - 2011 International Conference on Electronic Packaging Technology and High Density Packaging
Pages137-140
Number of pages4
DOIs
StatePublished - 2011
Externally publishedYes
Event2011 12th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2011 - Shanghai, China
Duration: 8 Aug 201111 Aug 2011

Publication series

NameICEPT-HDP 2011 Proceedings - 2011 International Conference on Electronic Packaging Technology and High Density Packaging

Conference

Conference2011 12th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2011
Country/TerritoryChina
CityShanghai
Period8/08/1111/08/11

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