Multispectral Non-invasive Inspection of Marqueteries Coupled with Finite Element Analyses

Yinuo Ding; Hai Zhang; Stefano Sfarra; Elena Pivarčiová; Xavier P.V. Maldague

doi:10.1007/978-3-031-42239-3_2

Multispectral Non-invasive Inspection of Marqueteries Coupled with Finite Element Analyses

Yinuo Ding
, Hai Zhang^*
, Stefano Sfarra
, Elena Pivarčiová
, Xavier P.V. Maldague

^*Corresponding author for this work

School of Astronautics

Harbin Institute of Technology
Université Laval
University of L'Aquila
Technical University in Zvolen

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Abstract

This work utilizes infrared and terahertz non-invasive imaging techniques to conduct a multispectral inspection of two marqueteries. Specifically, a flat sample with artificial defects and a curved sample without flaws are used. To cross-reference with the experimental results, a finite element simulation was carried out. Finally, two different experimental analyses and processing methods are compared, and their advantages and disadvantages are summarized.

Original language	English
Title of host publication	Springer Proceedings in Materials
Publisher	Springer
Pages	19-27
Number of pages	9
DOIs	https://doi.org/10.1007/978-3-031-42239-3_2
State	Published - 2024

Publication series

Name	Springer Proceedings in Materials
Volume	33
ISSN (Print)	2662-3161
ISSN (Electronic)	2662-317X

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

Keywords

Finite element analysis
Infrared
Marquetry
NDT
Terahertz

Access to Document

10.1007/978-3-031-42239-3_2

Cite this

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title = "Multispectral Non-invasive Inspection of Marqueteries Coupled with Finite Element Analyses",

abstract = "This work utilizes infrared and terahertz non-invasive imaging techniques to conduct a multispectral inspection of two marqueteries. Specifically, a flat sample with artificial defects and a curved sample without flaws are used. To cross-reference with the experimental results, a finite element simulation was carried out. Finally, two different experimental analyses and processing methods are compared, and their advantages and disadvantages are summarized.",

keywords = "Finite element analysis, Infrared, Marquetry, NDT, Terahertz",

author = "Yinuo Ding and Hai Zhang and Stefano Sfarra and Elena Pivar{\v c}iov{\'a} and Maldague, \{Xavier P.V.\}",

note = "Publisher Copyright: {\textcopyright} The Author(s), under exclusive license to Springer Nature Switzerland AG 2024.",

year = "2024",

doi = "10.1007/978-3-031-42239-3\_2",

language = "英语",

series = "Springer Proceedings in Materials",

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T1 - Multispectral Non-invasive Inspection of Marqueteries Coupled with Finite Element Analyses

AU - Ding, Yinuo

AU - Zhang, Hai

AU - Sfarra, Stefano

AU - Pivarčiová, Elena

AU - Maldague, Xavier P.V.

PY - 2024

Y1 - 2024

N2 - This work utilizes infrared and terahertz non-invasive imaging techniques to conduct a multispectral inspection of two marqueteries. Specifically, a flat sample with artificial defects and a curved sample without flaws are used. To cross-reference with the experimental results, a finite element simulation was carried out. Finally, two different experimental analyses and processing methods are compared, and their advantages and disadvantages are summarized.

AB - This work utilizes infrared and terahertz non-invasive imaging techniques to conduct a multispectral inspection of two marqueteries. Specifically, a flat sample with artificial defects and a curved sample without flaws are used. To cross-reference with the experimental results, a finite element simulation was carried out. Finally, two different experimental analyses and processing methods are compared, and their advantages and disadvantages are summarized.

KW - Finite element analysis

KW - Infrared

KW - Marquetry

KW - NDT

KW - Terahertz

UR - https://www.scopus.com/pages/publications/85178115178

U2 - 10.1007/978-3-031-42239-3_2

DO - 10.1007/978-3-031-42239-3_2

M3 - 章节

AN - SCOPUS:85178115178

T3 - Springer Proceedings in Materials

SP - 19

EP - 27

BT - Springer Proceedings in Materials

PB - Springer

ER -

Multispectral Non-invasive Inspection of Marqueteries Coupled with Finite Element Analyses

Abstract

Publication series

UN SDGs

Keywords

Access to Document

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