MSAM: a multi-scale attention mechanism for improving industrial defect segmentation

  • Menghao Han
  • , Zhenyan Ji*
  • , Yanyan Yang
  • , Qibo Feng
  • , Shen Yin
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

We propose a novel multi-scale attention mechanism (MSAM) that specifically addresses the challenges of environmental noise in industrial defect segmentation. The MSAM is composed of two submodules, namely the multi-scale feature filtering (MSFF) submodule and the scale selection (SS) submodule. The MSFF generates spatial attention weights that provide precise spatial location guidance for multi-scale features. This enhances the regions of interest while suppressing irrelevant regions. Additionally, the SS adaptively models the interdependencies between the channels of multi-scale features and assigns different weights to different channels. Experiments on the three industrial datasets demonstrate that the application of the MSAM module can effectively tackle the influence of complex noise in industrial segmentation and significantly improve the accuracy of industrial defect segmentation.

Original languageEnglish
Pages (from-to)16969-16982
Number of pages14
JournalNeural Computing and Applications
Volume37
Issue number21
DOIs
StatePublished - Jul 2025
Externally publishedYes

Keywords

  • Attention mechanism
  • Convolutional neural network
  • Defect segmentation
  • Industrial applications

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