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Morphology, kinetics and service reliability of Cu6Sn5 texture formed on Sn/Cu interface

  • Zhihao Zhang*
  • , Huijun Cao
  • , Yong Xiao
  • , Mingyu Li
  • *Corresponding author for this work
  • Harbin Institute of Technology Shenzhen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We proposed a hexagonal-rod growth behavior to describe the growth mechanism of the intermetallic Cu6Sn5 phase inside the liquid Sn-base solder. We found that the interfacial Cu6Sn5 phase formed on Sn/Cu joint interface also has the similar characteristics in terms of the shapes and surface textures. Based on this anisotropic growth behavior, a supply-controlled kinetic model of Cu6Sn5 phase was established. In addition, this study could deepen our understanding of the solid-state phase transformation in Cu6Sn5, and also be of great significance in the interfacial reliability of solder interconnections.

Original languageEnglish
Title of host publication2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014
EditorsKeyun Bi, Zhong Tian, Ziqiang Xu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1056-1059
Number of pages4
ISBN (Electronic)9781479947072
DOIs
StatePublished - 13 Oct 2014
Event2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014 - Chengdu, China
Duration: 12 Aug 201415 Aug 2014

Publication series

NameProceedings of the Electronic Packaging Technology Conference, EPTC

Conference

Conference2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014
Country/TerritoryChina
CityChengdu
Period12/08/1415/08/14

Keywords

  • CuSn
  • anisotropic growth
  • hexagonal-rod shape
  • kinetics
  • service reliability

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