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Modified Stability Analysis Model for Paralleled Grid-Connected VSIs Based on Coupled Sequence-Admittance

  • School of Electrical Engineering and Automation, Harbin Institute of Technology
  • Qingdao University of Science and Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

New studies on grid-connected voltage-source inverters (VSIs) show that sequence-admittance-based stability analysis model cannot be simply simplified as decoupled positive-sequence and negative-sequence impedance ratio because of sequence-couplings resulting from the outer asymmetric power control loops, such as the phase locked loop (PLL) and direct voltage control. Additionally, compared with single grid-connected VSI system, parallel-connected VSIs have stronger circuit-couplings via grid impedance. To get accurate stability conclusions in wider frequency range, both couplings are considered in this paper, and this paper firstly derives a sequence-admittance-based stability analysis model to capture resonances in parallel-connected VSIs. The proposed model is described as open-loop model and closed-loop model, to which Nyquist stability criterion is effectively applied instead of the complicated generalized Nyquist stability criterion. Take the PLL-induced low-frequency resonance for example, stability analysis of the studied cases is successfully conducted. Finally, time-domain simulations verify the accuracy and simplicity of the proposed model.

Original languageEnglish
Title of host publicationProceedings
Subtitle of host publicationIECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society
PublisherIEEE Computer Society
Pages4746-4751
Number of pages6
ISBN (Electronic)9781728148786
DOIs
StatePublished - Oct 2019
Externally publishedYes
Event45th Annual Conference of the IEEE Industrial Electronics Society, IECON 2019 - Lisbon, Portugal
Duration: 14 Oct 201917 Oct 2019

Publication series

NameIECON Proceedings (Industrial Electronics Conference)
Volume2019-October

Conference

Conference45th Annual Conference of the IEEE Industrial Electronics Society, IECON 2019
Country/TerritoryPortugal
CityLisbon
Period14/10/1917/10/19

Keywords

  • couplings
  • parallel-connected VSIs
  • sequence admittance
  • stability analysis model

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