TY - GEN
T1 - Modified Stability Analysis Model for Paralleled Grid-Connected VSIs Based on Coupled Sequence-Admittance
AU - Yu, Yanxue
AU - Li, Haoyu
AU - Zhang, Mengxiang
AU - Zheng, Xuemei
AU - Li, Zhenwei
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/10
Y1 - 2019/10
N2 - New studies on grid-connected voltage-source inverters (VSIs) show that sequence-admittance-based stability analysis model cannot be simply simplified as decoupled positive-sequence and negative-sequence impedance ratio because of sequence-couplings resulting from the outer asymmetric power control loops, such as the phase locked loop (PLL) and direct voltage control. Additionally, compared with single grid-connected VSI system, parallel-connected VSIs have stronger circuit-couplings via grid impedance. To get accurate stability conclusions in wider frequency range, both couplings are considered in this paper, and this paper firstly derives a sequence-admittance-based stability analysis model to capture resonances in parallel-connected VSIs. The proposed model is described as open-loop model and closed-loop model, to which Nyquist stability criterion is effectively applied instead of the complicated generalized Nyquist stability criterion. Take the PLL-induced low-frequency resonance for example, stability analysis of the studied cases is successfully conducted. Finally, time-domain simulations verify the accuracy and simplicity of the proposed model.
AB - New studies on grid-connected voltage-source inverters (VSIs) show that sequence-admittance-based stability analysis model cannot be simply simplified as decoupled positive-sequence and negative-sequence impedance ratio because of sequence-couplings resulting from the outer asymmetric power control loops, such as the phase locked loop (PLL) and direct voltage control. Additionally, compared with single grid-connected VSI system, parallel-connected VSIs have stronger circuit-couplings via grid impedance. To get accurate stability conclusions in wider frequency range, both couplings are considered in this paper, and this paper firstly derives a sequence-admittance-based stability analysis model to capture resonances in parallel-connected VSIs. The proposed model is described as open-loop model and closed-loop model, to which Nyquist stability criterion is effectively applied instead of the complicated generalized Nyquist stability criterion. Take the PLL-induced low-frequency resonance for example, stability analysis of the studied cases is successfully conducted. Finally, time-domain simulations verify the accuracy and simplicity of the proposed model.
KW - couplings
KW - parallel-connected VSIs
KW - sequence admittance
KW - stability analysis model
UR - https://www.scopus.com/pages/publications/85084032322
U2 - 10.1109/IECON.2019.8927624
DO - 10.1109/IECON.2019.8927624
M3 - 会议稿件
AN - SCOPUS:85084032322
T3 - IECON Proceedings (Industrial Electronics Conference)
SP - 4746
EP - 4751
BT - Proceedings
PB - IEEE Computer Society
T2 - 45th Annual Conference of the IEEE Industrial Electronics Society, IECON 2019
Y2 - 14 October 2019 through 17 October 2019
ER -