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Modeling of thickness of the oxide film in ELID grinding

  • Huali Zhang*
  • , Jicai Kuai
  • , Feihu Zhang
  • *Corresponding author for this work
  • Nantong University
  • Henan Polytechnic University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The properties of oxide films are very important for improving the mass of ELID grinding surface. In this paper, a novel calculation model of thickness of oxide films was proposed; the theoretical calculation and simulation analysis were developed, and were compared with the corresponding experimental results. The results proved that the theoretical calculation and simulation results of the thickness of the oxide films had good agreement with the experimental results. This model could predict precisely the change of thickness of oxide film, the instinct of non-linear electrolysis was explained from a novel aspect of ability of pulsed electrolysis. This model could be used in the on-line control of electrolytic state during practical ELID grinding process.

Original languageEnglish
Title of host publicationSurface Finishing Technology and Surface Engineering II
Pages376-381
Number of pages6
DOIs
StatePublished - 2010
EventInternational Conference on Surface Finishing Technology and Surface Engineering, ICSFT2010 - Guangzhou, China
Duration: 5 Nov 20107 Nov 2010

Publication series

NameAdvanced Materials Research
Volume135
ISSN (Print)1022-6680

Conference

ConferenceInternational Conference on Surface Finishing Technology and Surface Engineering, ICSFT2010
Country/TerritoryChina
CityGuangzhou
Period5/11/107/11/10

Keywords

  • Computational model
  • DC-pulse power
  • ELID grinding technique
  • Oxide film

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