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Modeling of coupling loss in ultra-compact SOI microring resonators

  • Haili Hu*
  • , Baojun Zuo
  • , Jianjun Liu
  • , Zhigang Fan
  • , Yingtao Jiang
  • *Corresponding author for this work
  • School of Astronautics, Harbin Institute of Technology
  • University of Nevada, Las Vegas
  • Daqing Petroleum Institute

Research output: Contribution to journalArticlepeer-review

Abstract

Ultra-compact microring resonators, made of high index contrast (HIC)-silicon on insulator (SOI) mate-rials, have become key optical devices in integrated photonics systems. Both computer simulations andactual experiments have showed that coupling loss was a significant contributor to the total losses inultra-compact microring resonators. In this paper, a computable model derived from step approximationmethod was present to theoretically determine the coupling loss. Excellent matching results betweenthe model and literatures were achieved. The proposed model can be applied to evaluate the couplingloss for microring resonators with various geometries and guide the design of low loss optical devicesbased on ultra-compact microring resonators.

Original languageEnglish
Pages (from-to)6355-6357
Number of pages3
JournalOptik
Volume124
Issue number23
DOIs
StatePublished - Dec 2013
Externally publishedYes

Keywords

  • Coupling loss
  • Integrated optics
  • Microring resonator
  • Silicon on insulator insulator

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