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Model Calibration in Dense Classification with Adaptive Label Perturbation

  • Jiawei Liu*
  • , Changkun Ye
  • , Shan Wang
  • , Ruikai Cui
  • , Jing Zhang
  • , Kaihao Zhang
  • , Nick Barnes
  • *Corresponding author for this work
  • Australian National University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

For safety-related applications, it is crucial to produce trustworthy deep neural networks whose prediction is associated with confidence that can represent the likelihood of correctness for subsequent decision-making. Existing dense binary classification models are prone to being over-confident. To improve model calibration, we propose Adaptive Stochastic Label Perturbation (ASLP) which learns a unique label perturbation level for each training image. ASLP employs our proposed Self-Calibrating Binary Cross Entropy (SC-BCE) loss, which unifies label perturbation processes including stochastic approaches (like DisturbLabel), and label smoothing, to correct calibration while maintaining classification rates. ASLP follows Maximum Entropy Inference of classic statistical mechanics to maximise prediction entropy with respect to missing information. It performs this while: (1) preserving classification accuracy on known data as a conservative solution, or (2) specifically improves model calibration degree by minimising the gap between the prediction accuracy and expected confidence of the target training label. Extensive results demonstrate that ASLP can significantly improve calibration degrees of dense binary classification models on both in-distribution and out-of-distribution data. The code is available on https://github.com/Carlisle-Liu/ASLP.

Original languageEnglish
Title of host publicationProceedings - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1173-1184
Number of pages12
ISBN (Electronic)9798350307184
DOIs
StatePublished - 2023
Externally publishedYes
Event2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Paris, France
Duration: 2 Oct 20236 Oct 2023

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499

Conference

Conference2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
Country/TerritoryFrance
CityParis
Period2/10/236/10/23

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