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Mittag-Leffler kernel-based oversampling collocation method for fractional initial value problems with contaminated data

  • X. Y. Li*
  • , B. Y. Wu
  • , X. Y. Liu
  • *Corresponding author for this work
  • Changshu Institute of Technology
  • Hainan University

Research output: Contribution to journalArticlepeer-review

Abstract

Mittag-Leffler RKFs were introduced by Rosenfeld et al. based on the RKFs, a numerical approach called kernelized ABM was developed for solving fractional initial value problems (FIVPs). However, the accuracy of the obtained approximate solution degraded when the fractional order tends to small values. By employing the Mittag-Leffler RKFs, we develop an oversampling collocation technique for Caputo FIVPs with contaminated data. The method can yield higher accurate approximated solution even though the order of the considered FIVPs is small. Also, the approach can improve the numerical instabilities and reduce the influences of noise data.

Original languageEnglish
Article number109073
JournalApplied Mathematics Letters
Volume153
DOIs
StatePublished - Jul 2024

Keywords

  • Collocation technique
  • Fractional initial value problems
  • Mittag-Leffler kernel

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