Abstract
In the (Bi1 − xCex)VO4 (0 ≤ x ≤ 1) system, we found that the (Bi1 − xCex)VO4 (0 ≤ x ≤ 0.1) belongs to the monoclinic scheelite phase and the (Bi1 − xCex)VO4 (0.7 ≤ x ≤ 1) belongs to the tetragonal zircon phase, while the (Bi1 − xCex)VO4 (0.1 < x < 0.7) belongs to the mixed phases of both monoclinic scheelite and tetragonal zircon structure. Interestingly, two components with near-zero temperature coefficient of resonant frequency (TCF) appeared in this system. In our previous work, a near-zero TCF of ~+15 ppm/°C was obtained in a (Bi0.75Ce0.25)VO4 ceramic with a permittivity (εr) of ~47.9 and a Qf (Q = quality factor = 1/dielectric loss; f = resonant frequency) value of ~18 000 GHz (at 7.6 GHz). Furthermore, in the present work, another temperature-stable microwave dielectric ceramic was obtained in (Bi0.05Ce0.95)VO4 composition sintered at 950°C and exhibits good microwave dielectric properties with a εr of ~11.9, a Qf of ~22 360 GHz (at 10.6 GHz), and a near-zero TCF of ~+6.6 ppm/°C. The results indicate that this system might be an interesting candidate for microwave device applications.
| Original language | English |
|---|---|
| Pages (from-to) | 423-431 |
| Number of pages | 9 |
| Journal | Journal of the American Ceramic Society |
| Volume | 103 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1 Jan 2020 |
| Externally published | Yes |
Keywords
- X-ray methods
- dielectric properties
- low temperature
- solid solutions
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