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Microwave dielectric properties of temperature-stable zircon-type (Bi, Ce)VO4 solid solution ceramics

  • Huan Huan Guo
  • , Di Zhou*
  • , Wen Feng Liu
  • , Li Xia Pang
  • , Da Wei Wang
  • , Jin Zhan Su
  • , Ze Ming Qi
  • *Corresponding author for this work
  • Xi'an Jiaotong University
  • Xi'an Jiaotong University
  • Xi'an Technological University
  • University of Sheffield
  • University of Science and Technology of China

Research output: Contribution to journalArticlepeer-review

Abstract

In the (Bi1 − xCex)VO4 (0 ≤ x ≤ 1) system, we found that the (Bi1 − xCex)VO4 (0 ≤ x ≤ 0.1) belongs to the monoclinic scheelite phase and the (Bi1 − xCex)VO4 (0.7 ≤ x ≤ 1) belongs to the tetragonal zircon phase, while the (Bi1 − xCex)VO4 (0.1 < x < 0.7) belongs to the mixed phases of both monoclinic scheelite and tetragonal zircon structure. Interestingly, two components with near-zero temperature coefficient of resonant frequency (TCF) appeared in this system. In our previous work, a near-zero TCF of ~+15 ppm/°C was obtained in a (Bi0.75Ce0.25)VO4 ceramic with a permittivity (εr) of ~47.9 and a Qf (Q = quality factor = 1/dielectric loss; f = resonant frequency) value of ~18 000 GHz (at 7.6 GHz). Furthermore, in the present work, another temperature-stable microwave dielectric ceramic was obtained in (Bi0.05Ce0.95)VO4 composition sintered at 950°C and exhibits good microwave dielectric properties with a εr of ~11.9, a Qf of ~22 360 GHz (at 10.6 GHz), and a near-zero TCF of ~+6.6 ppm/°C. The results indicate that this system might be an interesting candidate for microwave device applications.

Original languageEnglish
Pages (from-to)423-431
Number of pages9
JournalJournal of the American Ceramic Society
Volume103
Issue number1
DOIs
StatePublished - 1 Jan 2020
Externally publishedYes

Keywords

  • X-ray methods
  • dielectric properties
  • low temperature
  • solid solutions

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