Abstract
Vacuum brazing of SiO2 glass ceramic and TC4 alloy using a commercially available TiZrNiCu foil was investigated. The interfacial microstructure and the fractures were examined with an optical microscope (OM) and an S-4700 scanning electron microscope (SEM) equipped with an energy dispersive spectrometer (EDS) and an electron probe X-ray microanalyzer (EPMA). The structure of joint interface was identified by XRD (JDX-3530M). Meanwhile, the fracture paths of the joints were comprehensively studied. The results show that processing parameters, especially the brazing temperature, have a significant effect on the microstructure and mechanical properties of joints. The typical interface structure is SiO2/Ti2O+Zr 3Si2+Ti5Si3/(Ti,Zr)+Ti 2O+TiZrNiCu/Ti(s.s)/TiZrNiCu+Ti(s.s)+Ti2(Cu,Ni)/TC4 from SiO2 glass ceramic to TC4 alloy side. Based on the mechanical property tests, the joints brazed at 880 °C for 5 min has the maximum shear strength of 23 MPa.
| Original language | English |
|---|---|
| Pages (from-to) | 713-718 |
| Number of pages | 6 |
| Journal | Journal of Central South University of Technology (English Edition) |
| Volume | 16 |
| Issue number | 5 |
| DOIs | |
| State | Published - Oct 2009 |
Keywords
- Brazing
- Joints interface
- Mechanical properties
- Microstructure
- SiO glass ceramic
- TC4 alloy
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