Micro structure Analysis and the Effect of Cr Additive on Electrical Performance of (CP-Nb)/Cu-Cd Electrical Contact Materials

Y. S. Cui; Y. Wang; W. Z. Shao; L. Zhen; V. V. Ivanov

doi:10.1109/HOLM.2006.284077

Micro structure Analysis and the Effect of Cr Additive on Electrical Performance of (C_P-Nb)/Cu-Cd Electrical Contact Materials

Y. S. Cui^*
, Y. Wang
, W. Z. Shao
, L. Zhen
, V. V. Ivanov

^*Corresponding author for this work

Harbin Institute of Technology
Siberian Federal University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

8 Scopus citations

Abstract

(C_P-Nb)/Cu-Cd electrical contact material, which contains 1.7wt.% of Cd, 0.5wt.% of C_P (man-made diamond particles) and 2.0 wt.% of Nb, is fabricated by powder metallurgy process and is considered to be used as a low cost substitute of silver-based contacts in heavy duty AC contactors. The existing state of each element was analyzed and the improvement of arc erosion resistance was achieved by introducing a small amount of Cr additive. Microstructure investigation revealed that a fine crystal transition layer was formed around the embedded Nb particles to enhance the binding force between Nb particles and Cu-Cd alloy basis, and then improved the arc erosion resistance of this material. The addition of Cr could also reduce the penetration depth of fissures that pierces into contact material during the arc erosion test. Evaluated from of arc erosion duration and temperature rise test results, an optimal 0.7wt.% Cr content was concluded.

Original language	English
Title of host publication	Electrical Contacts 2006
Subtitle of host publication	Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	136-142
Number of pages	7
ISBN (Print)	1424405815, 9781424405817
DOIs	https://doi.org/10.1109/HOLM.2006.284077
State	Published - 2006
Externally published	Yes
Event	52nd IEEE Holm Conference on Electrical Contacts, Holm 2006 - Montreal, QC, Canada Duration: 25 Jul 2006 → 27 Jul 2006

Publication series

Name	Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts
ISSN (Print)	0361-4395

Conference

Conference	52nd IEEE Holm Conference on Electrical Contacts, Holm 2006
Country/Territory	Canada
City	Montreal, QC
Period	25/07/06 → 27/07/06

Keywords

Arc erosion performance
Copper based composite
Electrical contact materials

Access to Document

10.1109/HOLM.2006.284077

Cite this

Cui, Y. S., Wang, Y., Shao, W. Z., Zhen, L., & Ivanov, V. V. (2006). Micro structure Analysis and the Effect of Cr Additive on Electrical Performance of (C_P-Nb)/Cu-Cd Electrical Contact Materials. In Electrical Contacts 2006: Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts (pp. 136-142). Article 4063113 (Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/HOLM.2006.284077

Cui, Y. S. ; Wang, Y. ; Shao, W. Z. et al. / Micro structure Analysis and the Effect of Cr Additive on Electrical Performance of (C_P-Nb)/Cu-Cd Electrical Contact Materials. Electrical Contacts 2006: Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts. Institute of Electrical and Electronics Engineers Inc., 2006. pp. 136-142 (Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts).

@inproceedings{07e5151ab024417795b50320e0a3e561,

title = "Micro structure Analysis and the Effect of Cr Additive on Electrical Performance of (CP-Nb)/Cu-Cd Electrical Contact Materials",

abstract = "(CP-Nb)/Cu-Cd electrical contact material, which contains 1.7wt.\% of Cd, 0.5wt.\% of CP (man-made diamond particles) and 2.0 wt.\% of Nb, is fabricated by powder metallurgy process and is considered to be used as a low cost substitute of silver-based contacts in heavy duty AC contactors. The existing state of each element was analyzed and the improvement of arc erosion resistance was achieved by introducing a small amount of Cr additive. Microstructure investigation revealed that a fine crystal transition layer was formed around the embedded Nb particles to enhance the binding force between Nb particles and Cu-Cd alloy basis, and then improved the arc erosion resistance of this material. The addition of Cr could also reduce the penetration depth of fissures that pierces into contact material during the arc erosion test. Evaluated from of arc erosion duration and temperature rise test results, an optimal 0.7wt.\% Cr content was concluded.",

keywords = "Arc erosion performance, Copper based composite, Electrical contact materials",

author = "Cui, \{Y. S.\} and Y. Wang and Shao, \{W. Z.\} and L. Zhen and Ivanov, \{V. V.\}",

year = "2006",

doi = "10.1109/HOLM.2006.284077",

language = "英语",

isbn = "1424405815",

series = "Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "136--142",

booktitle = "Electrical Contacts 2006",

address = "美国",

note = "52nd IEEE Holm Conference on Electrical Contacts, Holm 2006 ; Conference date: 25-07-2006 Through 27-07-2006",

}

Cui, YS, Wang, Y , Shao, WZ, Zhen, L & Ivanov, VV 2006, Micro structure Analysis and the Effect of Cr Additive on Electrical Performance of (C_P-Nb)/Cu-Cd Electrical Contact Materials. in Electrical Contacts 2006: Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts., 4063113, Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts, Institute of Electrical and Electronics Engineers Inc., pp. 136-142, 52nd IEEE Holm Conference on Electrical Contacts, Holm 2006, Montreal, QC, Canada, 25/07/06. https://doi.org/10.1109/HOLM.2006.284077

Micro structure Analysis and the Effect of Cr Additive on Electrical Performance of (C_P-Nb)/Cu-Cd Electrical Contact Materials. / Cui, Y. S.; Wang, Y.; Shao, W. Z. et al.
Electrical Contacts 2006: Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts. Institute of Electrical and Electronics Engineers Inc., 2006. p. 136-142 4063113 (Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Micro structure Analysis and the Effect of Cr Additive on Electrical Performance of (CP-Nb)/Cu-Cd Electrical Contact Materials

AU - Cui, Y. S.

AU - Wang, Y.

AU - Shao, W. Z.

AU - Zhen, L.

AU - Ivanov, V. V.

PY - 2006

Y1 - 2006

N2 - (CP-Nb)/Cu-Cd electrical contact material, which contains 1.7wt.% of Cd, 0.5wt.% of CP (man-made diamond particles) and 2.0 wt.% of Nb, is fabricated by powder metallurgy process and is considered to be used as a low cost substitute of silver-based contacts in heavy duty AC contactors. The existing state of each element was analyzed and the improvement of arc erosion resistance was achieved by introducing a small amount of Cr additive. Microstructure investigation revealed that a fine crystal transition layer was formed around the embedded Nb particles to enhance the binding force between Nb particles and Cu-Cd alloy basis, and then improved the arc erosion resistance of this material. The addition of Cr could also reduce the penetration depth of fissures that pierces into contact material during the arc erosion test. Evaluated from of arc erosion duration and temperature rise test results, an optimal 0.7wt.% Cr content was concluded.

AB - (CP-Nb)/Cu-Cd electrical contact material, which contains 1.7wt.% of Cd, 0.5wt.% of CP (man-made diamond particles) and 2.0 wt.% of Nb, is fabricated by powder metallurgy process and is considered to be used as a low cost substitute of silver-based contacts in heavy duty AC contactors. The existing state of each element was analyzed and the improvement of arc erosion resistance was achieved by introducing a small amount of Cr additive. Microstructure investigation revealed that a fine crystal transition layer was formed around the embedded Nb particles to enhance the binding force between Nb particles and Cu-Cd alloy basis, and then improved the arc erosion resistance of this material. The addition of Cr could also reduce the penetration depth of fissures that pierces into contact material during the arc erosion test. Evaluated from of arc erosion duration and temperature rise test results, an optimal 0.7wt.% Cr content was concluded.

KW - Arc erosion performance

KW - Copper based composite

KW - Electrical contact materials

UR - https://www.scopus.com/pages/publications/38549149731

U2 - 10.1109/HOLM.2006.284077

DO - 10.1109/HOLM.2006.284077

M3 - 会议稿件

AN - SCOPUS:38549149731

SN - 1424405815

SN - 9781424405817

T3 - Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

SP - 136

EP - 142

BT - Electrical Contacts 2006

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 52nd IEEE Holm Conference on Electrical Contacts, Holm 2006

Y2 - 25 July 2006 through 27 July 2006

ER -

Cui YS, Wang Y , Shao WZ, Zhen L, Ivanov VV. Micro structure Analysis and the Effect of Cr Additive on Electrical Performance of (C_P-Nb)/Cu-Cd Electrical Contact Materials. In Electrical Contacts 2006: Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts. Institute of Electrical and Electronics Engineers Inc. 2006. p. 136-142. 4063113. (Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts). doi: 10.1109/HOLM.2006.284077