Skip to main navigation Skip to search Skip to main content

Metagrating for Single Order Diffraction with High Efficiency Based on Bianisotropic Particles

  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A novel metagrating is proposed to achieve single order diffraction. The proposed unit has electric and magnetic hybrid response. The unit is composed of asymmetrical patch. By introducing magnetic response, the element will break the symmetry of diffraction. One of the first order diffraction is canceled and the energy is totally reflected into the other order at 10GHz. Besides, the diffraction efficiency is higher than 80% from 9.4GHz to 11.1GHz. The simulated far field pattern shows good agreement with prediction. The proposed design provide a highly efficient method to suppress 0 and +1 order diffraction and simplify the difficulty of design, paving the way for further applications of beam steering.

Original languageEnglish
Title of host publicationICEICT 2020 - IEEE 3rd International Conference on Electronic Information and Communication Technology
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages347-349
Number of pages3
ISBN (Electronic)9781728190457
DOIs
StatePublished - 13 Nov 2020
Event3rd IEEE International Conference on Electronic Information and Communication Technology, ICEICT 2020 - Shenzhen, China
Duration: 13 Nov 202015 Nov 2020

Publication series

NameICEICT 2020 - IEEE 3rd International Conference on Electronic Information and Communication Technology

Conference

Conference3rd IEEE International Conference on Electronic Information and Communication Technology, ICEICT 2020
Country/TerritoryChina
CityShenzhen
Period13/11/2015/11/20

Keywords

  • diffraction order
  • magnetic response
  • metagrating

Fingerprint

Dive into the research topics of 'Metagrating for Single Order Diffraction with High Efficiency Based on Bianisotropic Particles'. Together they form a unique fingerprint.

Cite this