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MetaF2N: Blind Image Super-Resolution by Learning Efficient Model Adaptation from Faces

  • Zhicun Yin
  • , Ming Liu*
  • , Xiaoming Li
  • , Hui Yang
  • , Longan Xiao
  • , Wangmeng Zuo
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • Shanghai Transsion Co., Ltd.
  • Peng Cheng Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Due to their highly structured characteristics, faces are easier to recover than natural scenes for blind image super-resolution. Therefore, we can extract the degradation representation of an image from the low-quality and recovered face pairs. Using the degradation representation, realistic low-quality images can then be synthesized to fine-tune the super-resolution model for the real-world low-quality image. However, such a procedure is time-consuming and laborious, and the gaps between recovered faces and the ground-truths further increase the optimization uncertainty. To facilitate efficient model adaptation towards image-specific degradations, we propose a method dubbed MetaF2N, which leverages the contained Faces to fine-tune model parameters for adapting to the whole Natural image in a Meta-learning framework. The degradation extraction and low-quality image synthesis steps are thus circumvented in our MetaF2N, and it requires only one fine-tuning step to get decent performance. Considering the gaps between the recovered faces and ground-truths, we further deploy a MaskNet for adaptively predicting loss weights at different positions to reduce the impact of low-confidence areas. To evaluate our proposed MetaF2N, we have collected a real-world low-quality dataset with one or multiple faces in each image, and our MetaF2N achieves superior performance on both synthetic and real-world datasets. Source code, pre-trained models, and collected datasets are available at https://github.com/yinzhicun/MetaF2N.

Original languageEnglish
Title of host publicationProceedings - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages12987-12998
Number of pages12
ISBN (Electronic)9798350307184
DOIs
StatePublished - 2023
Event2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Paris, France
Duration: 2 Oct 20236 Oct 2023

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499

Conference

Conference2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
Country/TerritoryFrance
CityParis
Period2/10/236/10/23

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