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Mechanism of different switching directions in graphene oxide based RRAM

  • Zhongrui Wang*
  • , V. Tjoa
  • , L. Wu
  • , W. J. Liu
  • , Z. Fang
  • , X. A. Tran
  • , J. Wei
  • , W. G. Zhu
  • , H. Y. Yu
  • *Corresponding author for this work
  • Nanyang Technological University
  • Agency for Science, Technology and Research, Singapore
  • Tianjin University of Technology
  • Southern University of Science and Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Resistive switching in Graphene Oxide (GO) based RRAM has been studied in combination with various commonly used electrodes e.g. Al, Cu, Ni and Ti. For the first time, coexistence of different reproducible switching directions has been observed in the Al/GO/Pt and the Ti/GO/Pt RRAM cells. These switching directions are correlated to the underlying switching mechanisms as revealed by field dependence, temperature dependence and area dependence. Our observation also suggests that both oxygen related functional groups absorptionrelease and electrode metal ions diffusion play important roles in bipolar resistive switching of GO.

Original languageEnglish
Pages (from-to)K177-K182
JournalJournal of the Electrochemical Society
Volume159
Issue number6
DOIs
StatePublished - 2012
Externally publishedYes

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 7 - Affordable and Clean Energy
    SDG 7 Affordable and Clean Energy

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