Abstract
Resistive switching in Graphene Oxide (GO) based RRAM has been studied in combination with various commonly used electrodes e.g. Al, Cu, Ni and Ti. For the first time, coexistence of different reproducible switching directions has been observed in the Al/GO/Pt and the Ti/GO/Pt RRAM cells. These switching directions are correlated to the underlying switching mechanisms as revealed by field dependence, temperature dependence and area dependence. Our observation also suggests that both oxygen related functional groups absorptionrelease and electrode metal ions diffusion play important roles in bipolar resistive switching of GO.
| Original language | English |
|---|---|
| Pages (from-to) | K177-K182 |
| Journal | Journal of the Electrochemical Society |
| Volume | 159 |
| Issue number | 6 |
| DOIs | |
| State | Published - 2012 |
| Externally published | Yes |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
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