TY - GEN
T1 - Measuring of spectral BRDF using fiber optic spectrometer
AU - Zhang, Wei
AU - Wang, Fugang
AU - Wang, Zhile
AU - Wang, Hongyuan
PY - 2010
Y1 - 2010
N2 - We designed a new spectral bidirectional reflection distribution function (BRDF) measurement instrument, which can be utilized to measure isotropic materials simply in laboratory. The measurement instrument consists of a fiber optic spectrometer, a three-dimensional turntable, a halogen light source and a computer. The spectrometer acquires 696 samples in visible band. The angular range controlled by three-dimensional turntable is 0∼330° and 0∼80° for azimuth angle and zenith angle respectively. The halogen light source supplies a continuous spectrum with high efficiency and stability in the wavelength range from 360∼1500 nm. The spectrometer and the three-dimensional turntable connect with the computer. The angle rotation and data acquisition are all controlled by the computer. The spectral BRDF measurement of three materials is conducted. The relation of spectral BRDF, wavelength and reflected zenith angle is presented. In conclusion, the designed spectral BRDF measurement system can acquire spectral BRDF data quickly and accurately, thus it is an efficient way to measure material spectral reflected properties which is need for computer rendering, target identification.
AB - We designed a new spectral bidirectional reflection distribution function (BRDF) measurement instrument, which can be utilized to measure isotropic materials simply in laboratory. The measurement instrument consists of a fiber optic spectrometer, a three-dimensional turntable, a halogen light source and a computer. The spectrometer acquires 696 samples in visible band. The angular range controlled by three-dimensional turntable is 0∼330° and 0∼80° for azimuth angle and zenith angle respectively. The halogen light source supplies a continuous spectrum with high efficiency and stability in the wavelength range from 360∼1500 nm. The spectrometer and the three-dimensional turntable connect with the computer. The angle rotation and data acquisition are all controlled by the computer. The spectral BRDF measurement of three materials is conducted. The relation of spectral BRDF, wavelength and reflected zenith angle is presented. In conclusion, the designed spectral BRDF measurement system can acquire spectral BRDF data quickly and accurately, thus it is an efficient way to measure material spectral reflected properties which is need for computer rendering, target identification.
KW - Reflection characteristics
KW - spectral BRDF measurement
KW - uncertainty analysis
KW - validation
UR - https://www.scopus.com/pages/publications/78650462075
U2 - 10.1117/12.866129
DO - 10.1117/12.866129
M3 - 会议稿件
AN - SCOPUS:78650462075
SN - 9780819480880
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies
T2 - 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Y2 - 26 April 2010 through 29 April 2010
ER -