TY - GEN
T1 - Measuring arc temperature distribution and its time-evolution based on relative intensity method
AU - Zhou, Xue
AU - Zhang, Yong
AU - Zhai, Guofu
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/10/26
Y1 - 2017/10/26
N2 - Temperature distribution and its time evolution are fundamental physics of arcs occurring during breaking process in electro-mechanic devices, which largely determine contact erosion. Aimed to the highly fluctuating switching arc, we implemented an optical system based on relatively strength of two individual spectrum emitted by the same excited atoms inside the plasma. Light emitted from arc is firstly split into two same beams by using a triangular prism. Then, the beams pass through two narrow-band optical filters with different central wavelengths. Finally, the filtered arcs are projected to the CMOS sensor of a high-speed camera. An algorithm based on relative intensity of two spectrum is developed to calculate the temperature on each pixels after image correction. Test results for typical arcs are also shown.
AB - Temperature distribution and its time evolution are fundamental physics of arcs occurring during breaking process in electro-mechanic devices, which largely determine contact erosion. Aimed to the highly fluctuating switching arc, we implemented an optical system based on relatively strength of two individual spectrum emitted by the same excited atoms inside the plasma. Light emitted from arc is firstly split into two same beams by using a triangular prism. Then, the beams pass through two narrow-band optical filters with different central wavelengths. Finally, the filtered arcs are projected to the CMOS sensor of a high-speed camera. An algorithm based on relative intensity of two spectrum is developed to calculate the temperature on each pixels after image correction. Test results for typical arcs are also shown.
KW - Arc
KW - Relative intensity method
KW - Spectrum
KW - Temperature distribution
UR - https://www.scopus.com/pages/publications/85039148905
U2 - 10.1109/HOLM.2017.8088068
DO - 10.1109/HOLM.2017.8088068
M3 - 会议稿件
AN - SCOPUS:85039148905
T3 - Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts
SP - 80
EP - 85
BT - Electrical Contacts - 2017, Proceedings of the 63rd IEEE Holm Conference on Electrical Contacts, Holm 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 63rd IEEE Holm Conference on Electrical Contacts, Holm 2017
Y2 - 10 September 2017 through 13 September 2017
ER -