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Measurement of third-order nonlinear refraction using a nonlinear-imaging technique with positive-negative phase object

  • Y. Li
  • , Y. Song*
  • , J. Yang
  • , K. Yang
  • , X. Zhang
  • , Y. Wang
  • *Corresponding author for this work
  • Soochow University
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

A unique phase object (PO) with both positive and negative phase retardation is used in the nonlinear-imaging technique with a phase object (NIT-PO) to measure the nonlinear refractive index of materials. Using positive-negative PO, one can increase the sensitivity of the NIT-PO compared with the conventional uniform PO. The improvement of sensitivity is especially significant at negative nonlinear shift regions, and can reach an order of magnitude near the nonlinear phase shift ΔℓNL=-π. The sensitivity increase of the NIT-PO with positive-negative PO is from 1.7 to 3.0 times greater when compared with the Z-scan technique within ΔℓNLℓ|π|. An empirical expression is obtained which allows for direct calculation of the Kerr coefficient from measured the nonlinear image. CS2 is used to demonstrate the measurement using a positive-negative PO.

Original languageEnglish
Pages (from-to)253-257
Number of pages5
JournalApplied Physics B: Lasers and Optics
Volume92
Issue number2
DOIs
StatePublished - Aug 2008

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