@inproceedings{9c91058538da47a9a9f97c94170c7c84,
title = "Measurement and Analysis of Focus Dispersion in Infrared Compound-Eye Lens Array",
abstract = "Machining error and material stress are the main causes of focal length difference and mirror distortion of each sub-structure for the compound-eye lens array, which will cause each sub-aperture to defocus and increase the actual measurement error. In view of the difficulty in measuring the consistency of the axial focus position of large-scale infrared compound-eye lens array with a sub-aperture of millimeters, this paper proposes a measurement method based on the focal plane coupling parameter transmission in the optical system, and establishes an experimental measurement system for multi-aperture focal length consistency. The sharpness fixed focus method is used for the sampling precision measurement of the sub-aperture focal position consistency in an infrared compound-eye lens array. The measurement results show that the measured focal position range and the standard deviation of focal position are 21.0 μm and 6.26 μm, respectively. The measurement method for the multi-aperture focal position consistency proposed in this paper provides a quantitative evaluation method for the optical performance of the infrared compound-eye lens array.",
keywords = "focal position consistency, infrared compound-eye lens array, multi-aperture, sharpness fixed focus method",
author = "Jianjun Zhang and Jianying Li and Zhen Yang and Xinmin Guo and Jianlonz Zhang and Yong Zhang",
note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 15th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2021 ; Conference date: 29-10-2021 Through 31-10-2021",
year = "2021",
doi = "10.1109/ICEMI52946.2021.9679559",
language = "英语",
series = "2021 15th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2021",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "448--452",
editor = "Wu Juan and Yin Jiali",
booktitle = "2021 15th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2021",
address = "美国",
}