@inproceedings{224ada1e895a456ab4ef1168b4b53669,
title = "Martensitic transformation behavior of Ni54.75Mn 13.25Fe7Ga25 ferromagnetic shape memory thin film",
abstract = "The Ni54.75Mn13.25Fe7Ga25 (at.\%) ferromagnetic shape memory thin film was deposited onto silicon substrates using radio-frequency magnetron sputtering. The martensitic transformation, crystallographic structure, microstructure and magnetic-field induced strain were investigated by means of Differential Scanning Calorimetry (DSC), X-ray diffraction (XRD), Transmission Electron Microscope (TEM) and metal strain gauges. The results show that the martensite transformation temperature Ms is 296.6 K, the film with typical self-accommodated morphology is orthorhombic structure at room temperature. The field-induced strain of 52 ppm is obtained in this shape memory thin film.",
keywords = "Ni-Mn-Fe-Ga, Reverse martensitic transformation, Self-accommodated morphology, Thin film",
author = "Haibo Wang and Hao Xiong and Li Ma and Wei Cai",
year = "2011",
doi = "10.4028/www.scientific.net/KEM.474-476.408",
language = "英语",
isbn = "9783037850978",
series = "Key Engineering Materials",
publisher = "Trans Tech Publications Ltd",
pages = "408--412",
booktitle = "Advanced Materials and Computer Science",
address = "瑞士",
}