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Machine vision system for visual defect inspection of TFT-LCD

  • Yu Zhang*
  • , Jian Zhang
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

To improve the identification for visual defect of TFT-LCD, a new machine vision system is proposed, which is superior to human eye inspection. The system respectively employs a CCD camera to capture the image of TFT-LCD panel and an image processing system to identify potential visual defects. Image pre-processing, such as average filtering and geometric correction, was performed on the captured image, and then a candidate area of defect was segmented from the background. Feature information extracted from the area of interest entered a fuzzy rule-based classifier that simulated the defect inspection of TFT-LCD undertaken by experienced technicians. Experiment results show that the machine vision system can obtain fast, objective and accurate inspection compared with subjective and inaccurate human eye inspection.

Original languageEnglish
Pages (from-to)773-778
Number of pages6
JournalJournal of Harbin Institute of Technology (New Series)
Volume14
Issue number6
StatePublished - Dec 2007

Keywords

  • Fuzzy rule-based classifier
  • Image processing
  • Machine vision
  • TFT-LCD

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