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Low-Temperature Sintering Mechanism and Bonding Performance of Submicron Triangular Silver Paste for Advanced Electronic Packaging

  • Pengrong Lin
  • , Zirui Tong
  • , Shimeng Xu
  • , Yiping Wang
  • , Shang Wang*
  • , Yanhong Tian
  • *Corresponding author for this work
  • Beijing Microelectronics Technology Institute
  • Tsinghua University
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Silver pastes are promising joining materials for use in advanced electronic packaging, particularly in power electronics, due to their capacity for low-temperature joining and high-temperature operation. However, spherical silver particles suffer from low sintering efficiency and high porosity due to their limited contact areas. In this study, a submicron triangular silver flake paste was investigated to overcome these limitations. A high joint strength of 35.2 MPa with a low porosity of 9.48% was achieved at 250 °C via pressureless sintering. A relatively high thermal conductivity (134.9 W/(m·K)) was also achieved. This enhanced sintering performance is attributed to a unique mechanism involving distinct same-layer and inter-layer sintering processes at different temperatures. With these findings, we demonstrate that the submicron triangular silver flake paste is a high-strength, high-thermal-conductivity, low-temperature bonding material for advanced electronic packaging.

Original languageEnglish
Article number2182
JournalMaterials
Volume19
Issue number11
DOIs
StatePublished - Jun 2026

Keywords

  • advanced electronic packaging
  • paste
  • silver flakes
  • sintering mechanism

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