Skip to main navigation Skip to search Skip to main content

Low-temperature sintering and microwave dielectric properties of ZnGa2–xO4–1.5x ceramics with added B2O3

  • Junjia Xia
  • , Xing Hua Ma*
  • , Zhenlu Zhang*
  • , Sahn Nahm
  • , Shuling Zhang
  • , Xingyi Ma
  • , Feng Guo
  • *Corresponding author for this work
  • Qingdao University of Technology
  • Beijing University of Posts and Telecommunications
  • Korea University
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

In this work, ZnGa2–xO4–1.5x (0.0 ≤ x ≤ 0.15) ceramics were synthesized by a solid-state reaction method. ZnGa2O4 ceramic that is sintered at 1300 °C/3 h exhibits good microwave dielectric properties with εr of 11.06, Q × f of 74,730 GHz, and τf of − 69.7 ppm/°C. However, it cannot be fully densified at temperatures lower than 960 °C, even when a large amount of B2O3 is added, which seriously inhibits its application in the LTCC (low temperature cofired ceramic) field. Therefore, adding B2O3 to Ga2O3-deficient ZnGa2O4 ceramics is proposed to decrease the sintering temperature to below 960 °C. Owing to the dual effect of the B2O3-rich and ZnO-B2O3 related liquid phases, ceramics with added B2O3 (≥ 20 mol%) were found to sinter well at 950 °C, and good microwave dielectric properties were also achieved. In particular, 25 mol% B2O3 added to ZnGa1.95O3.925 ceramic sintered at 950 °C showed promising microwave dielectric properties for 5 G/6 G technologies without reaction with a silver electrode: εr = 9.19, Q × f = 37,337 GHz, and τf = − 58.3 ppm/°C.

Original languageEnglish
Article number1941
JournalJournal of Materials Science: Materials in Electronics
Volume34
Issue number28
DOIs
StatePublished - Oct 2023
Externally publishedYes

Fingerprint

Dive into the research topics of 'Low-temperature sintering and microwave dielectric properties of ZnGa2–xO4–1.5x ceramics with added B2O3'. Together they form a unique fingerprint.

Cite this