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Low cycle fatigue behavior of a eutectic 80Au/20Sn solder alloy

  • H. Y. Jing
  • , Y. Y. Zhang
  • , L. Y. Xu*
  • , G. S. Zhang
  • , Y. D. Han
  • , J. Wei
  • *Corresponding author for this work
  • Tianjin University
  • Tianjin Key Laboratory of Advanced Joining Technology
  • Agency for Science, Technology and Research, Singapore

Research output: Contribution to journalArticlepeer-review

Abstract

The eutectic 80Au/20Sn solder alloy is widely used in high power electronics and optoelectronics packaging. In this study, low cycle fatigue behavior of a eutectic 80Au/20Sn solder alloy is reported. The 80Au/20Sn solder shows a quasi-static fracture characteristic at high strain rates, and then gradually transforms from a transgranular fracture (dominated by fatigue damage) to intergranular fracture (dominated by creep damage) at low strain rates with increasing temperature. Coffin-Manson and Morrow models are proposed to evaluate the low cycle fatigue behavior of the 80Au/20Sn solder. Besides, the 80Au/20Sn solder has enhanced fatigue resistance compared to the 63Sn/37Pb solder.

Original languageEnglish
Pages (from-to)100-107
Number of pages8
JournalInternational Journal of Fatigue
Volume75
DOIs
StatePublished - Jun 2015
Externally publishedYes

Keywords

  • Coffin-Manson model
  • Eutectic 80Au/20Sn solder alloy
  • Failure mechanism
  • Low cycle fatigue
  • Morrow model

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