Abstract
The eutectic 80Au/20Sn solder alloy is widely used in high power electronics and optoelectronics packaging. In this study, low cycle fatigue behavior of a eutectic 80Au/20Sn solder alloy is reported. The 80Au/20Sn solder shows a quasi-static fracture characteristic at high strain rates, and then gradually transforms from a transgranular fracture (dominated by fatigue damage) to intergranular fracture (dominated by creep damage) at low strain rates with increasing temperature. Coffin-Manson and Morrow models are proposed to evaluate the low cycle fatigue behavior of the 80Au/20Sn solder. Besides, the 80Au/20Sn solder has enhanced fatigue resistance compared to the 63Sn/37Pb solder.
| Original language | English |
|---|---|
| Pages (from-to) | 100-107 |
| Number of pages | 8 |
| Journal | International Journal of Fatigue |
| Volume | 75 |
| DOIs | |
| State | Published - Jun 2015 |
| Externally published | Yes |
Keywords
- Coffin-Manson model
- Eutectic 80Au/20Sn solder alloy
- Failure mechanism
- Low cycle fatigue
- Morrow model
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