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LNPL-MIL: Learning from Noisy Pseudo Labels for Promoting Multiple Instance Learning in Whole Slide Image

  • Zhuchen Shao
  • , Yifeng Wang
  • , Yang Chen
  • , Hao Bian
  • , Shaohui Liu
  • , Haoqian Wang*
  • , Yongbing Zhang*
  • *Corresponding author for this work
  • Tsinghua University
  • Harbin Institute of Technology Shenzhen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Gigapixel Whole Slide Images (WSIs) aided patient diagnosis and prognosis analysis are promising directions in computational pathology. However, limited by expensive and time-consuming annotation costs, WSIs usually only have weak annotations, including 1) WSI-level Annotations (WA) and 2) Limited Patch-level Annotations (LPA). Currently, Multiple Instance Learning (MIL) often exploits WA, while LPA usually assign pseudo-labels for unlabeled data. Intuitively, pseudo-labels can serve as a practical guide for MIL, but the unreliable prediction caused by LPA inevitably introduce noise. Furthermore, WA-supervised MIL training inevitably suffers from the semantical unalignment between instances and bag-level labels. To address these problems, we design a framework called Learning from Noisy Pseudo Labels for promoting Multiple Instance Learning (LNPL-MIL), which considers both types of weak annotation. Specifically, for the LPA-trained weak classifier, we design a Super-Patch-based LNPL (SP-LNPL) method to reduce false positives in the noisy pseudo-labels and then select more accurate Top-K key instances. In MIL, we propose a Transformer aware of instance Order and Distribution (TOD-MIL) that strengthens instances correlation and weakens semantical unalignment in the bag. We validate our LNPL-MIL on Tumor Diagnosis and Survival Prediction, achieving state-of-the-art performance with at least 2.7%/2.9% AUC and 2.6%/2.3% C-Index improvement with the patches labeled for two scale. Ablation study and visualization analysis further verify the effectiveness.

Original languageEnglish
Title of host publicationProceedings - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages21438-21448
Number of pages11
ISBN (Electronic)9798350307184
DOIs
StatePublished - 2023
Event2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Paris, France
Duration: 2 Oct 20236 Oct 2023

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499

Conference

Conference2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
Country/TerritoryFrance
CityParis
Period2/10/236/10/23

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