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Linear-Structured-Light Measurement System Based on Scheimpflug Camera Thick-Lens Imaging

  • Dongyu Guo
  • , Jiwen Cui*
  • , Yuhang Wu
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

A thick-lens, structured-light measurement model is introduced to overcome the oversights in traditional models, which often disregard the impact of lens thickness. This oversight can lead to inaccuracies in Scheimpflug camera calculations, causing systematic errors and diminished measurement precision. By geometrical optics, the model treats the camera as a thick lens, factoring in the locations of its principal points and the spatial shifts due to image plane tilting. The model deduces the positional relationship of the thick lens with a tilted optical axis and establishes a linear-structured-light measurement model. Simulations confirm that the model can precisely calculate the 3D coordinates of subjects from image light strip data, markedly reducing systematic errors across the measurement spectrum. Moreover, experimental results suggest that the refined sensor model offers enhanced accuracy and lower standard deviation.

Original languageEnglish
Article number5124
JournalSensors
Volume24
Issue number16
DOIs
StatePublished - Aug 2024

Keywords

  • Scheimpflug camera
  • measurement field
  • measurement model
  • sensor
  • structured light

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