Abstract
To increase the efficiency of plasma immersion ion implantation (PIII) batching, a limited sheath-collision method is proposed. Sheath-collisions between three cylinders with a triangular configuration are studied using a 3-D particle-in-cell simulation. Influences of sheath-collision extent on dose uniformity are obtained, and a criteria for determining the critical that requires that sheath-collision at the center of the triangle be avoided is proposed. In addition, depth profiles of the implanted ion obtained in PIII batching demonstrate that the critical sheath-collision value has an obvious influence on the implantation depth and dose uniformity.
| Original language | English |
|---|---|
| Article number | 6522847 |
| Pages (from-to) | 1644-1647 |
| Number of pages | 4 |
| Journal | IEEE Transactions on Plasma Science |
| Volume | 41 |
| Issue number | 6 |
| DOIs | |
| State | Published - 2013 |
Keywords
- Ion implantation
- Simulation
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