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Large substructure identification using substructure isolation method

  • Jilin Hou*
  • , Łukasz Jankowski
  • , Jinping Ou
  • *Corresponding author for this work
  • Dalian University of Technology
  • Institute of Fundamental Technological Research of the Polish Academy of Sciences
  • School of Civil Engineering, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Substructure Isolation Method (SIM) is used for large substructure identification. It utilizes the responses of global structure to construct the responses of the isolated substructure, which is a virtual and independent structure with the same system parameters as the real substructure. Then, the substructure identification is carried out equivalently via the isolated substructure and flexibly by some of the existing identification methods which aim originally at the large structure. Therefore, the performance of the SIM offers the possibility that the large substructure can be identified. A numerical bridge model is used to verify the proposed method, which preforms efficiently and accurately.

Original languageEnglish
Title of host publicationSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2012
DOIs
StatePublished - 2012
Externally publishedYes
EventSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2012 - San Diego, CA, United States
Duration: 12 Mar 201215 Mar 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8345
ISSN (Print)0277-786X

Conference

ConferenceSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2012
Country/TerritoryUnited States
CitySan Diego, CA
Period12/03/1215/03/12

Keywords

  • Damage identification
  • Interface force
  • Structural Health Monitoring (SHM)
  • Substructure

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