Skip to main navigation Skip to search Skip to main content

Large-size Ho:Tm:YLF crystal grown by the Czochralski method

  • Xiaoming Ma
  • , Yongguo Wang
  • , Baoquan Yao
  • , Yanjun Cui
  • , Xiaogang Mo*
  • *Corresponding author for this work
  • Beijing Opto-Electronics Technology Co. Ltd.
  • Beijing University of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

The causes of the floating-debris on the surface of Ho:Tm:YLF melt, the scattering particles and the crack of Ho:Tm:YLF crystal during the Czochralski growth are analyzed in this paper. Through elaborately designing of the symmetry temperature field, and adjusting temperature gradient and the crystal growth process parameters, the scattering particles and the crack of the crystal are eliminated effectively. The growth atmosphere with a certain volume CF 4 contributes to decreasing the floating-debris on the melt surface effectively, and the influence of the floating-debris on the normal crystal growth are overcome. By above technique ways, high-quality Ho:Tm:YLF crystals with the size of φ(25-30) mm×(100-120) mm are grown. The laser performance test of Ho:Tm:YLF crystal shows that under LD double-end-pumped conditions more than 10 W laser at 2.05 μm is achieved, and the laser slope efficiency reaches 41.2%, optical-to-optical efficiency reaches 36.4%.

Original languageEnglish
Pages (from-to)s106003-1-s106003-4
JournalZhongguo Jiguang/Chinese Journal of Lasers
Volume38
Issue numberSUPPL. 1
DOIs
StatePublished - Dec 2011

Keywords

  • Crystal growth
  • Czochralski method
  • Ho:Tm:YLF crystal
  • Laser crystal
  • Laser performance
  • Materials

Fingerprint

Dive into the research topics of 'Large-size Ho:Tm:YLF crystal grown by the Czochralski method'. Together they form a unique fingerprint.

Cite this