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Joint Asymmetric Loss for Learning with Noisy Labels

  • Harbin Institute of Technology
  • Tsinghua University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Learning with noisy labels is a crucial task for training accurate deep neural networks. To mitigate label noise, prior studies have proposed various robust loss functions, particularly symmetric losses. Nevertheless, symmetric losses usually suffer from the underfitting issue due to the overly strict constraint. To address this problem, the Active Passive Loss (APL) jointly optimizes an active and a passive loss to mutually enhance the overall fitting ability. Within APL, symmetric losses have been successfully extended, yielding advanced robust loss functions. Despite these advancements, emerging theoretical analyses indicate that asymmetric losses, a new class of robust loss functions, possess superior properties compared to symmetric losses. However, existing asymmetric losses are not compatible with advanced optimization frameworks such as APL, limiting their potential and applicability. Motivated by this theoretical gap and the prospect of asymmetric losses, we extend the asymmetric loss to the more complex passive loss scenario and propose the Asymetric Mean Square Error (AMSE), a novel asymmetric loss. We rigorously establish the necessary and sufficient condition under which AMSE satisfies the asymmetric condition. By substituting the traditional symmetric passive loss in APL with our proposed AMSE, we introduce a novel robust loss framework termed Joint Asymmetric Loss (JAL). Extensive experiments demonstrate the effectiveness of our method in mitigating label noise. Code available at: https://github.com/cswjl/joint-asymmetric-loss

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1947-1956
Number of pages10
ISBN (Electronic)9798331587758
DOIs
StatePublished - 2025
Event2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025 - Honolulu, United States
Duration: 19 Oct 202523 Oct 2025

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499
ISSN (Electronic)2380-7504

Conference

Conference2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025
Country/TerritoryUnited States
CityHonolulu
Period19/10/2523/10/25

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