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Ion beam profile diagnostic methods for vacuum arc ion source in sealed-tube neutron generator

  • Zhen Yang
  • , Jidong Long
  • , Xiaohu Wang
  • , Chaohui Lan
  • , Jie Li
  • , Yufei Peng
  • , Tao Wang
  • , Pan Dong
  • , Ping Liu
  • , Jialong He
  • China Academy of Engineering Physics

Research output: Contribution to journalArticlepeer-review

Abstract

The pulsed ion beam from a vacuum arc source in a compact sealed-tube neutron generator owns many special features, such as multiparticle mixture beams, high-intensity beams, short pulsewidth beams, transporting in a single gap acceleration system, and eccentric beams. Beam profile and composition are useful information for designing a high-intensity sealed-tube neutron generator, especially for the insulation withstand of the device, the life of the tritium target, the neutron yield, and so on. An improved traditional online diagnostic method that uses an aluminum-coated scintillator screen and a novel offline diagnostic method that is based on secondary ion mass spectrometry are introduced, respectively. The preliminary experimental results can show the intensity distribution of the ion beam profile and the composition with high resolution. The results from the two methods can fit each other well.

Original languageEnglish
Article numberA4
Pages (from-to)2070-2074
Number of pages5
JournalIEEE Transactions on Plasma Science
Volume43
Issue number6
DOIs
StatePublished - 1 Jun 2015
Externally publishedYes

Keywords

  • Beam profile
  • Neutron generator
  • Scintillator screen
  • Secondary ion mass spectrometry (SIMS)
  • Vacuum arc ion source

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