Invited Review Article: A review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements

Yang Gan

doi:10.1063/1.2754076

Invited Review Article: A review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements

Yang Gan^*

^*Corresponding author for this work

University of Newcastle
University of Melbourne

Research output: Contribution to journal › Article › peer-review

88 Scopus citations

Abstract

Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.

Original language	English
Article number	081101
Journal	Review of Scientific Instruments
Volume	78
Issue number	8
DOIs	https://doi.org/10.1063/1.2754076
State	Published - 2007
Externally published	Yes

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10.1063/1.2754076

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abstract = "Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.",

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year = "2007",

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AB - Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.

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Invited Review Article: A review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements

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